Patents by Inventor Kenneth A. Bird

Kenneth A. Bird has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7734444
    Abstract: Systems and arrangements to assess the thermal performance of a thermal solution based upon the ability of a device under test (DUT) to operate in accordance with electrical performance criteria are contemplated. Embodiments may include a tester to couple with the DUT to determine an operating junction temperature. In some embodiments, the measured junction temperature may be the operating junction temperature anticipated for the DUT in a customer installation. In other embodiments, the tester may comprise logic to calculate a projected, operating junction temperature based upon the measured junction temperature and known differences between the tester and a customer installation. Upon determining the operating junction temperature for the DUT at the customer installation, the operating junction temperature is compared against a maximum junction temperature for proper operation of the DUT. Advantageously, the maximum junction temperature may be varied based upon the project objective for a line of DUTs.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: June 8, 2010
    Assignee: International Business Machines Corporation
    Inventors: Ronald Xavier Arroyo, Kenneth A. Bird, William A. Ciarfella, Bret Peter Elison, Gary Franklin Goth, Terrance Wayne Kueper, Thoi Nguyen, Roger Donell Weekly
  • Publication number: 20080112456
    Abstract: Systems and arrangements to assess the thermal performance of a thermal solution based upon the ability of a device under test (DUT) to operate in accordance with electrical performance criteria are contemplated. Embodiments may include a tester to couple with the DUT to determine an operating junction temperature. In some embodiments, the measured junction temperature may be the operating junction temperature anticipated for the DUT in a customer installation. In other embodiments, the tester may comprise logic to calculate a projected, operating junction temperature based upon the measured junction temperature and known differences between the tester and a customer installation. Upon determining the operating junction temperature for the DUT at the customer installation, the operating junction temperature is compared against a maximum junction temperature for proper operation of the DUT. Advantageously, the maximum junction temperature may be varied based upon the project objective for a line of DUTs.
    Type: Application
    Filed: November 9, 2007
    Publication date: May 15, 2008
    Inventors: Ronald Xavier Arroyo, Kenneth A. Bird, William A. Ciarfella, Bret Peter Elison, Gary Franklin Goth, Terrance Wayne Kueper, Thoi Nguyen, Roger Donell Weekly
  • Patent number: 7338818
    Abstract: Systems and arrangements to assess the thermal performance of a thermal solution based upon the ability of a device under test (DUT) to operate in accordance with electrical performance criteria are contemplated. Embodiments may include a tester to couple with the DUT to determine an operating junction temperature. In some embodiments, the measured junction temperature may be the operating junction temperature anticipated for the DUT in a customer installation. In other embodiments, the tester may comprise logic to calculate a projected, operating junction temperature based upon the measured junction temperature and known differences between the tester and a customer installation. Upon determining the operating junction temperature for the DUT at the customer installation, the operating junction temperature is compared against a maximum junction temperature for proper operation of the DUT. Advantageously, the maximum junction temperature may be varied based upon the project objective for a line of DUTs.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: March 4, 2008
    Assignee: International Business Machines Corporation
    Inventors: Ronald Xavier Arroyo, Kenneth A. Bird, William A. Ciarfella, Bret Peter Elison, Gary Franklin Goth, Terrance Wayne Kueper, Thoi Nguyen, Roger Donell Weekly
  • Patent number: 6285080
    Abstract: The present invention relates generally to new planar substrates that are metallized and embedded with material to minimize the camber and method thereof. The invention also relates to the fabrication of multilayer ceramic (MLC) substrates for packaging electronic devices. More particularly, this invention relates to the fabrication of thin and small ceramic substrates which do not need post-sintering processing to control the flatness of the sintered product.
    Type: Grant
    Filed: November 23, 1998
    Date of Patent: September 4, 2001
    Assignee: International Business Machines Corporation
    Inventors: Raschid J. Bezama, Kenneth A. Bird, Alan Piciacchio, Robert A. Rita
  • Patent number: 5831810
    Abstract: An electronic component package comprising a substrate having at least one die-receiving cavity formed therein, the cavity being defined by a die-receiving surface and an inner sidewall having a terraced contour, the substrate having an exterior surface bordering the cavity perimeter, the inner sidewall extending between the die-receiving surface and the substrate exterior surface, and at least one capacitor positioned completely within the cavity and mounted to the terraced contour of the inner sidewall.
    Type: Grant
    Filed: August 21, 1996
    Date of Patent: November 3, 1998
    Assignee: International Business Machines Corporation
    Inventors: Kenneth A. Bird, Peter J. Brofman, Francis F. Cappo, Jr., Jason L. Frankel, Suresh D. Kadakia, Sarah Huffsmith Knickerbocker, Scott A. Sikorski
  • Patent number: 5220617
    Abstract: A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultipliers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.
    Type: Grant
    Filed: September 4, 1991
    Date of Patent: June 15, 1993
    Assignee: International Business Machines Corporation
    Inventors: Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp
  • Patent number: 5216485
    Abstract: A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultiplers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.
    Type: Grant
    Filed: September 4, 1991
    Date of Patent: June 1, 1993
    Assignee: International Business Machines Corporation
    Inventors: Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp