Abstract: The present invention provides methods and systems for repeatably creating and severing a short circuit to protect an electronic component from ESD. A short circuit may be formed between read sensor pads of a read sensor by depositing a shorting material on a magnetic head using a Laser Induced Forward Transfer (LIFT) process. The short circuit may be unshorted using a laser scan configured to sever the shorting material. In one embodiment, a shorting station may be provided to prevent spreading of the shorting material to undesired areas of the electronic component.

Abstract: The present invention provides methods and systems for repeatably creating and severing a short circuit to protect an electronic component from ESD. A short circuit may be formed between read sensor pads of a read sensor by depositing a shorting material on a magnetic head using a Laser Induced Forward Transfer (LIFT) process. The short circuit may be unshorted using a laser scan configured to sever the shorting material. In one embodiment, a shorting station may be provided to prevent spreading of the shorting material to undesired areas of the electronic component.

Abstract: A spin valve sensor in a read head has a spacer layer which is located between a self-pinned AP pinned layer structure and a free layer structure. The free layer structure is longitudinally stabilized by first and second hard bias layers which abut first and second side surfaces of the spin valve sensor. The AP pinned layer structure has an antiparallel coupling layer (APC) which is located between first and second AP pinned layers (AP1) and (AP2). The invention employs a resetting process for setting of the magnetic moments of the AP pinned layers by applying a field at an acute angle to the head surface in a plane parallel to the major planes of the layers of the sensor. The resetting process sets a proper polarity of each AP pinned layer, which polarity conforms to processing circuitry employed with the spin valve sensor.

Abstract: A precisely machined test nest holds a single hard disk drive slider. The test nest is fabricated to contain a micro pickup coil that is positioned to be able to detect magnetic flux from a write element of the slider. The micro pickup coil has highly repeatable and controllable positioning with respect to the write element. This technique also allows local magnetic field to be applied to the read element, and its small size allows excitation at higher frequencies than are currently achievable today. The coil is lithographically defined and integrated into the test nest and used on single slider testers. The low inductance of the coil allows it to be driven at high frequencies. Its position within the test nest ensures good heat sinking and enables large current pulses to be employed.

Abstract: A structure is integrated into the design and manufacture of a magnetic head that allows self-generation of magnetic fields. The structure includes a conductor or conductors placed in close proximity to the read portion of a magnetic head and connected to an externally accessible connection. A high frequency signal is passed through the conductor to generate a magnetic field through the read device and simulate, for example, the head crossing magnetic domains on a magnetic memory disk.

Abstract: A structure is integrated into the design and manufacture of a magnetic head that allows self-generation of magnetic fields. The structure includes a conductor or conductors placed in close proximity to the read portion of a magnetic head and connected to an externally accessible connection. A high frequency signal is passed through the conductor to generate a magnetic field through the read device and simulate, for example, the head crossing magnetic domains on a magnetic memory disk.

Abstract: A system for measuring the magnetostriction coefficient &lgr; of a sample material applied to a substrate element fixed at one end leaving the other end free to be deflected. An external rotating magnetic field of rotation frequency f and intensity Hext is applied to the cantilever substrate element the amplitude Am of the deflection of the free end is measured at each of a plurality of rotation frequency harmonics {fm} by, for example, using a plurality of lock-in amplifiers. The harmonic deflection amplitudes {Am} are combined to determine the magnetostriction coefficient &lgr; of the sample material. At an Hext equal to the sample saturation moment Msat and assuming a 15 Oe sample anisotropy Hk and coupling bias Hp, the error in the saturation magnetostriction coefficient &lgr;S measured according to this invention may be reduced by 80% to 90% over the error seen when using only the second harmonic deflection amplitudes A2.

Abstract: A method is disclosed for determining the presence of response abnormalities in magnetic sensors. The method includes placing the sensor in an applied magnetic field and collecting sensor resistance information as the magnitude and direction of the applied field is altered. The resistance values are then examined to determine the presence of response abnormalities.

Abstract: A method is disclosed for determining the presence of response abnormalities in magnetic sensors. The method includes placing the sensor in an applied magnetic field and collecting sensor resistance information as the magnitude and direction of the applied field is altered. The resistance values are then examined to determine the presence of response abnormalities.

Abstract: A method and system for the rapid automatic screening of GMR heads for Barkhausen noise during production. This system rapidly and repeatedly measures associated noise in a GMR head subjected to a smoothly-varying external transverse magnetic field. The repeated Transverse Magnetic-field Excited Noise (TMEN) measurements are automatically sorted into bins to form a histogram, which is then automatically evaluated to develop TMEN range and weighted sum measures, which are then compared with predetermined standards for automatic acceptance or rejection of the GMR head under test. The GMR sensor Barkhausen noise is quantified through the use of a bandpass filter to remove all direct sensor responses, leaving only the noise signals, which are then repeatedly sampled to develop valid statistical Barkhausen noise measures suitable for automated analysis.

Abstract: A method and system for the rapid automatic screening of GMR heads for Barkhausen noise during production. This system rapidly and repeatedly measures associated noise in a GMR head subjected to a smoothly-varying external transverse magnetic field. The repeated Transverse Magnetic-field Excited Noise (TMEN) measurements are automatically sorted into bins to form a histogram, which is then automatically evaluated to develop TMEN range and weighted sum measures, which are then compared with predetermined standards for automatic acceptance or rejection of the GMR head under test. The GMR sensor Barkhausen noise is quantified through the use of a bandpass filter to remove all direct sensor responses, leaving only the noise signals, which are then repeatedly sampled to develop valid statistical Barkhausen noise measures suitable for automated analysis.