Patents by Inventor Kenneth Edward James, Jr.

Kenneth Edward James, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10088413
    Abstract: Methods and systems for calibrating system parameter values of a target inspection system are presented. Spectral Error Based Calibration (SEBC) increases consistency among inspection systems by minimizing differences in the spectral error among different inspection systems for a given specimen or set of specimens. The system parameter values are determined such that differences between a spectral error associated with a measurement of a specimen by the target inspection system and a spectral error associated with a measurement of the same specimen by a reference inspection system are minimized. In some examples, system parameter values are calibrated without modifying specimen parameters. Small inaccuracies in specimen parameter values have little effect on the calibration because the target system and the reference system both measure the same specimen or set of specimens. By performing SEBC over a set of specimens, the resulting calibration is robust to a wide range of specimens under test.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: October 2, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Hidong Kwak, Zhiming Jiang, Ward RDell Dixon, Kenneth Edward James, Jr., Leonid Poslavsky, Torsten Kaack