Patents by Inventor Kenneth J. Hollman

Kenneth J. Hollman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspecting one or more apertures of a component using moldable material
    Patent number: 10203196
    Abstract: A method is provided for inspecting at least one aperture of a component with curable material and an inspection system. At least a portion of the curable material is injected into the aperture. The curable material conforms to at least a portion the aperture and subsequently cures and forms a mold of at least a portion of the aperture. The mold is removed from the aperture. At least a portion of a geometry of the mold is compared to at least a portion of a geometry of a reference model for the aperture using the inspection system.
    Type: Grant
    Filed: February 25, 2014
    Date of Patent: February 12, 2019
    Assignee: United Technologies Corporation
    Inventors: Gordon M. Reed, James Romanelli, James M. Koonankeil, Kevin J. Klinefelter, Markus W. Fritch, Kenneth J. Hollman, Jeffrey S. Beattie
  • INSPECTING ONE OR MORE APERTURES OF A COMPONENT USING MOLDABLE MATERIAL
    Publication number: 20160003607
    Abstract: A method is provided for inspecting at least one aperture of a component with curable material and an inspection system. At least a portion of the curable material is injected into the aperture. The curable material conforms to at least a portion the aperture and subsequently cures and forms a mold of at least a portion of the aperture. The mold is removed from the aperture. At least a portion of a geometry of the mold is compared to at least a portion of a geometry of a reference model for the aperture using the inspection system.
    Type: Application
    Filed: February 25, 2014
    Publication date: January 7, 2016
    Inventors: Gordon M. Reed, James Romanelli, James M. Koonankeil, Kevin J. Klinefelter, Markus W. Fritch, Kenneth J. Hollman, Jeffrey S. Beattie