Patents by Inventor Kenneth John Lieber

Kenneth John Lieber has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Control feedback system and method for bulk material industrial processes using automated object or particle analysis
    Patent number: 6885904
    Abstract: A control feedback system and method for industrial processes using automated particle or object analysis is disclosed. The control feedback system and method includes a particle characteristic measuring unit to obtain first measured characteristics of a first sample and second measured characteristics of a second sample, the first sample having a substantially different characteristic than the second sample; an optimal characteristic definition for comparison with the first and second measured characteristics; a corrective action database to define and select actions to be taken in response to a comparison of the first and second measured characteristics with the optimal characteristic definition; and a control line network to transfer control signal to a plurality of processing units in response to a selected action to be taken. Other methods and apparatuses are also described.
    Type: Grant
    Filed: July 12, 2002
    Date of Patent: April 26, 2005
    Assignee: Advanced Vision Particle Measurement, Inc.
    Inventors: Kenneth John Lieber, Ian B. Browne, John Tuttle
  • Control feedback system and method for bulk material industrial processes using automated object or particle analysis
    Patent number: 6629010
    Abstract: A control feedback system and method for industrial processes using automated particle or object analysis is disclosed. The control feedback system and method includes a particle characteristic measuring unit to obtain measured characteristics of a bulk material sample; an optimal characteristic definition for comparison with the measured characteristics; a corrective action database for defining and selecting actions to be taken in response to a comparison of the measured characteristics with the optimal characteristic definition; and a control line network to transfer control signals to a plurality of processing units in response to a selected action to be taken.
    Type: Grant
    Filed: May 18, 2001
    Date of Patent: September 30, 2003
    Assignee: Advanced Vision Particle Measurement, Inc.
    Inventors: Kenneth John Lieber, Ian B. Browne
  • Control feedback system and method for bulk material industrial processes using automated object or particle analysis
    Publication number: 20020170367
    Abstract: A control feedback system and method for industrial processes using automated particle or object analysis is disclosed. The control feedback system and method includes a particle characteristic measuring unit to obtain measured characteristics of a bulk material sample; an optimal characteristic definition for comparison with the measured characteristics; a corrective action database for defining and selecting actions to be taken in response to a comparison of the measured characteristics with the optimal characteristic definition; and a control line network to transfer control signals to a plurality of processing units in response to a selected action to be taken.
    Type: Application
    Filed: May 18, 2001
    Publication date: November 21, 2002
    Inventors: Kenneth John Lieber, Ian B. Browne