Abstract: Provided herein are systems, methods, and articles of manufacture for automated antimicrobial testing. In particular, the systems and methods provided herein are directed to automated antimicrobial susceptibility testing platforms and methods for identification of synergistic antimicrobials that are faster, more precise, and less expensive than gold standard susceptibility methodologies.

Abstract: Embodiments allow for rapid antimicrobial susceptibility testing (AST) at a low cost. Embodiments may use changes in the pixel intensity from reflected light to determine microorganism growth and antimicrobial resistance. Dilutions of an antimicrobial are added to a standard well plate or other array. A pathogen or other microorganism may be added to the dilutions in the well plate. The well plate may be incubated for a time period less than 3 hours. The well plate may then be imaged and the resulting image data may be analyzed. Wells where the microorganism is able to grow may appear darker than wells where the microorganism did not grow. Differences pixel intensity of the wells is used to determine the susceptibility or resistance of the microorganism to the antimicrobial. The image data may be used to determine the minimum inhibitory concentration (MIC), the lowest dilution concentration of antimicrobial that inhibits growth.

Abstract: In accordance with some embodiments of the disclosed subject matter, provided herein are mechanisms (which can, for example, include systems, methods, and media) for automatically interpreting and classifying images of Gram-stained biological samples.

Abstract: Described are techniques for preventing movement of tuning pegs on a stringed instrument. Described is a device comprising an elongated body forming a sleeve opened at a first end thereof and having a slit formed therein. The body has a shape and dimensions in accordance with a shape and dimensions of a row of a plurality of tuning pegs of the stringed instrument so that the body is configured to enclose therein head portions of the plurality of tuning pegs. The slit is configured to have a length and width to extend around neck portions of the plurality of tuning pegs on the stringed instrument.

Abstract: A vertical MOSFET structure which includes a drain which comprises a high conductivity region and a low conductivity region. The high conductivity drain region is contoured so as to minimize the device turn-on resistance without degrading the device breakdown voltage.