Patents by Inventor Kenneth Paul Tumin

Kenneth Paul Tumin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for producing test patterns for testing an integrated circuit
    Patent number: 7047174
    Abstract: A test pattern generation flow has a stimulus and a device under test (DUT) that operate together through a test bench. The test bench monitors and collects all the data necessary to generate a test program. This information is presented as a captured simulation that allows for ease of generating test software, as well as other simulations such as fault simulation and virtual test simulation. The complete and convenient information can be utilized to automate the development and/or easily manually develop and debug the test software.
    Type: Grant
    Filed: May 2, 2001
    Date of Patent: May 16, 2006
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Alex S. Y. Koh, Alan Joseph Carlin, Kenneth Paul Tumin, Hubert Glenn Carson, Jr.
  • Method for producing test patterns for testing an integrated circuit
    Publication number: 20020163351
    Abstract: A test pattern generation flow has a stimulus and a device under test (DUT) that operate together through a test bench. The test bench monitors and collects all the data necessary to generate a test program. This information is presented as a captured simulation that allows for ease of generating test software, as well as other simulations such as fault simulation and virtual test simulation. The complete and convenient information can be utilized to automate the development and/or easily manually develop and debug the test software.
    Type: Application
    Filed: May 2, 2001
    Publication date: November 7, 2002
    Inventors: Alex S.Y. Koh, Alan Joseph Carlin, Kenneth Paul Tumin, Hubert Glenn Carson