Abstract: An improved corner guard that consists of a guard body with an adhesive bottom surface layer, a pair of orthogonal fold lines designed to align with a pair of corner edges, a pair of fold-over tabs extending outwardly from the fold lines, the tabs designed to fold over the corner edges and adhere to a back surface of the corner. A folding enhancement means, such as a perforated or pre-scored line is positioned along the length of the tabs on the fold lines so that the tabs can be quickly and properly folded. A pair of fixed edge tab portions extend inwardly from the fold lines, and preferably include at least one curvilinear portion, and a central portion extends inwardly from the fixed edge tab portions. The central portion extends away from the corner, and may additionally include one or more curvilinear portions to prevent objects from catching or tearing on the corner guard.

Abstract: A contactor including a test fixture for receiving an integrated circuit chip mounted in a carrier package and for providing contacts with electrical conductor pads of the package to facilitate electrical testing thereof is provided. The test fixture comprises a plurality of contact members mounted to a spring-loaded plunger. Each contact member includes a strip of conductive fingers with protruding contacts for springing engagement with the conductor pads of the carrier when the plunger is depressed. The test fixture resides in a cavity of a housing unit and is aligned with a central aperture therein. In operation, a ram holding the carrier lowers it through the central aperture of the housing unit and onto the plunger. The carrier is then pressed against the plunger, causing it to depress. This allows the carrier conductor pads to frictionally engage the protruding contacts of the conductive fingers, thus effectuating electrical contact.

Abstract: A planar contact set for use in a test fixture for receiving an integrated circuit package for facilitating the electrical connection thereof to test equipment so that electrical and electronic tests can be performed on the integrated circuit. The contact set includes a flexible insulating support member having a central aperture which supports a plurality of conductive contact strips which extend over the aperture in cantilever fashion. The support member includes a support sheet underlying the contact strips and a retaining sheet overlying the contact strips, the sheets maintaining the strips in the proper position to contact the leads of the integrated circuit package when in a test registration position and also to enable electrical connections to be made to the test apparatus.

Abstract: A device that brings a vertically falling integrated circuit to a rapid, bounce-free stop at a test site includes a set of relatively lightweight blades arrayed next to the fall path with their faces in a mutually spaced relationship. At its upper end, each blade is pivotally and loosely mounted on an energy absorbing elastomeric sleeve. At its lower end, each blade carries a stop member that projects into the fall path when the blade is in a first ("test") position. The stop members are generally aligned with one another horizontally across the fall path to define a stop surface that precisely locates an integrated circuit at the test site. The device includes an arrangement for repeatedly drawing the lower ends of the blades in unison to a second ("release") position where the stop members are clear of the fall path.

Abstract: An automatic system for feeding integrated circuits (IC's) stored in hollow tubes to the input of a test handler/sorter has an accumulating conveyor table that carries the tubes laterally to a pick-up position. The conveyor table is inclined from the horizontal and a stop surface at its lower edge supports and aligns a closed end of each tube. Sensor assemblies limit the lateral movement of the leading tube, assist in orienting the tube, and detect when it is located at the pick-up position and is properly oriented. The sensor assemblies generate a control signal that activates a gripping assembly organized about a plate that pivots on a rotating support frame. The gripping assembly includes centering cam inserts on one movable gripping member. One motor mounted on the frame rotates the gripping assembly and the gripped tube to the test handler/sorter input. The gripping assembly has a mechanism for controlling the discharge of IC's from the open end of the tube.

Abstract: Integrated circuits (IC's) are stored for a time interval in a set of elongated guideways to bring them to a preselected temperature prior to testing. The guideways each hold a line of IC's in a loose end-to-end array. A frame carries the guideways. The frame and guideways rotate about a central shaft that is generally aligned with the guideways. The guideways are rotatably mounted in the frame and a gear system, preferably one carried on the frame and the guideways, ensures that as the frame rotates the guideways maintain the same angular orientation with respect to the horizontal. In the preferred form the guideways are generally tubular members with an upwardly facing open channel and an opposed, spaced apart rail that retain and guide the IC's. The entire frame and the guideways carried in the frame are inclined from the horizontal to provide a gravity feed of the IC's from one of the guideways located at an "unloading" position.

Abstract: A drive system flexes the free ends of two parallel sets of contacts into electrical connection with two parallel rows of leads on an integrated circuit. The drive system uses a pair of opposed, identical actuator arms. A common, movable pivot axis, preferably one defined by a link pin pivotally connected to both arms, connects one end of the arms. A solenoid drive is connected to the link pin. Activation of the solenoid draws the link pin towards it which rotates each arm about a fixed pivot point to generate a symmetrical, pincer-like movement of the free ends of the arms. Push bars secured to these free ends drive the contacts into a flexed position. The symmetrical motion of the push bars minimizes lateral movement of the integrated circuit and develops a generally uniform contact force at all of the leads. A cable with an adjustable length preferably couples the drive element with the link pin.

Abstract: Disclosed is an interface assembly for use in conjunction with a test contactor assembly for integrated circuit (IC) electronic devices and the like. The test contactor assembly has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generally parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally "characteristic" or purely resistive impedance that is frequency independent. The interface assembly, which connects the test contactor assembly to a test circuit, has a contactor board secured to the base of the contactor assembly. A pattern of conductive stripes is carried on at least one face of the board.

Abstract: A test contactor assembly for integrated circuit (IC) electronic devices and the like has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generlly parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally "characteristic" or purely resistive impedance that is frequency independent. A flexible insulating material is preferably located between the plate and its associated row of contacts to maintain the desired spacing as the plate and the contacts are flexed into electrical connection with associated pins of the device.