Abstract: A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin having a swaged head electrically connected to the external analyzer.

Abstract: A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin having a swaged head electrically connected to the external analyzer.

Abstract: A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin electrically connected to the external analyzer.

Abstract: A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.

Abstract: A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.

Abstract: A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin electrically connected to the external analyzer.

Abstract: A basketball return device (1) for securing to a basketball hoop rim (2), said basketball return device (1) having a circular ring (4), at least one clamp (30) secured to said circular ring (4) wherein said at least one clamp (30) removably secures said circular ring (4) to the basketball hoop rim (2), a directing frame (6) for directing movement of a basketball, O-shaped members (31) located on said directing frame (6) wherein said directing frame (6) is rotatably secured to said circular ring (4) via said O-shaped members (31) and at least on bracket (29) secured to said circular ring (4) wherein said at least one bracket (29) is mounted on the basketball hoop rim (2) when said basketball return device (1) is secured to the basketball hoop rim (4).

Abstract: A high speed interface receiver/transmitter is particularly suitable for enhancing data throughput rates between a DTE and a DCE, such as a modem. The high speed interface includes a driver programmed with high speed processing software. The driver operates in conjunction with modem firmware programmed in a programmable memory within the DCE to implement special firmware handshake protocol which enables the DTE to transmit or receive data as fast as necessary to sustain the required data rate of a particular operating mode.