Patents by Inventor Kenneth R. Wada

Kenneth R. Wada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7354704
    Abstract: High-throughput screening method and apparatus arm described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.
    Type: Grant
    Filed: October 29, 2002
    Date of Patent: April 8, 2008
    Assignee: CellStat Technologies, Inc.
    Inventors: Patricia J. Malin, Kenneth R. Wada, Peter J. Dehlinger
  • Publication number: 20030219824
    Abstract: High-throughput screening method and apparatus arm described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.
    Type: Application
    Filed: October 29, 2002
    Publication date: November 27, 2003
    Applicant: CellStat Technologies, Inc.
    Inventors: Patricia J. Malin, Kenneth R. Wada, Peter J. Dehlinger
  • Patent number: 6472144
    Abstract: High-throughput screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes paced in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.
    Type: Grant
    Filed: March 20, 2001
    Date of Patent: October 29, 2002
    Assignee: Cellstat Technologies, Inc.
    Inventors: Patricia J. Malin, Kenneth R. Wada, Peter J. Dehlinger
  • Publication number: 20020025575
    Abstract: High-throughput screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes paced in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.
    Type: Application
    Filed: March 20, 2001
    Publication date: February 28, 2002
    Applicant: CellStat Technologies, Inc.
    Inventors: Patricia J. Malin, Kenneth R. Wada, Peter J. Dehlinger
  • Patent number: 6235520
    Abstract: High-throughout screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of sells in each well being less that about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: May 22, 2001
    Assignee: Cellstat Technologies, Inc.
    Inventors: Patricia J. Malin, Kenneth R. Wada, Peter J. Dehlinger
  • Patent number: 5008081
    Abstract: Computer-controlled method and apparatus for automatic melt index testing, including a housing with a base carrying a heater block having a bore therein for receiving a metal cartridge. A cartridge carousel is rotatably carried on the base, and carries a plurality of such cartridges, each cartridge having a plug at the bottom end thereof with a orifice through the plug, and each cartridge having a bore therein for receiving a sample of a test substance and for receiving a piston on top of the pellets. A lift arm grasps the cartridges, one at a time, and places each cartridge into the heater block, under the control of a microcomputer, by both lifting and rotating the transfer arm. The transfer arm includes a solenoid-operated grip for grasping the cartridges.The test unit carries a lift mechanism with a weight mounted atop a tamping rod, and an optical sensor for determining the height of the weight relative to the lift machinism.
    Type: Grant
    Filed: October 11, 1988
    Date of Patent: April 16, 1991
    Assignee: KD Group
    Inventors: David A. Blau, John Meadows, Thomas M. Sherlock, Fred Stengel, Robert M. Studholme, Kenneth R. Wada, Christopher J. Kepner