Abstract: A method for damping vibrations in a stepper motor with micro-stepping control which comprises the steps of identifying the force amplitudes and phase shifts of multiple harmonic detent torques of the stepper motor, such as the first, second and fourth harmonic detent torques, and tuning the stepper motor with different current commands until minimum friction and resistive torque are obtained. Thereafter, a compensating harmonic current derived from said force amplitudes and phase shifts of the said multiple harmonic detent torques is injected into a current command during operation of the stepper motor to compensate for torque ripples.

Abstract: Various laser drivers and methods are provided. In one embodiment, a laser driver is provided that comprises a laser driver circuit having a common anode portion and a common cathode portion. The common anode portion and the common cathode portion are each configured to drive a laser. Also, the laser driver includes a control input to alternatively enable one of the common anode portion and the common cathode portion to drive the laser.

Abstract: An apparatus including a micro-mechanical calibration member having at least a portion that is elastically biasable away from a neutral position in response to mechanical contact. The apparatus may also include a fixed member proximate the micro-mechanical calibration member which may be referenced to automatically detect deflection of the micro-mechanical calibration member away from the neutral position. The micro-mechanical calibration member may also be configured to receive a micro-mechanical contacting member to provide the mechanical contact employed to bias the micro-mechanical calibration member away from the neutral position.

Abstract: A microelectronics apparatus comprising a substrate, a pair of grid electrodes coupled to the substrate on opposing sides of a central axis, wherein the grid electrodes are substantially parallel to each other and extend substantially perpendicular from the substrate, and a plurality of ion reflection lenses each coupled to the substrate, wherein each ion reflection lens: (1) is substantially perpendicular to each of the grid electrodes; (2) extends substantially perpendicular from the substrate; and (3) has an aperture aligned with the central axis.

Abstract: A method for damping vibrations in a stepper motor with micro-stepping control which comprises the steps of identifying the force amplitudes and phase shifts of multiple harmonic detent torques of the stepper motor, such as the first, second and fourth harmonic detent torques, and tuning the stepper motor with different current commands until minimum friction and resistive torque are obtained. Thereafter, a compensating harmonic current derived from said force amplitudes and phase shifts of the said multiple harmonic detent torques is injected into a current command during operation of the stepper motor to compensate for torque ripples.

Abstract: A microelectronics apparatus comprising a substrate, a pair of grid electrodes coupled to the substrate on opposing sides of a central axis, wherein the grid electrodes are substantially parallel to each other and extend substantially perpendicular from the substrate, and a plurality of ion reflection lenses each coupled to the substrate, wherein each ion reflection lens: (1) is substantially perpendicular to each of the grid electrodes; (2) extends substantially perpendicular from the substrate; and (3) has an aperture aligned with the central axis.

Abstract: An apparatus including a micro-mechanical calibration member having at least a portion that is elastically biasable away from a neutral position in response to mechanical contact. The apparatus may also include a fixed member proximate the micro-mechanical calibration member which may be referenced to automatically detect deflection of the micro-mechanical calibration member away from the neutral position. The micro-mechanical calibration member may also be configured to receive a micro-mechanical contacting member to provide the mechanical contact employed to bias the micro-mechanical calibration member away from the neutral position.

Abstract: An apparatus including at least three deflectable members each configured to deflect during assembly with a component, and also configured to remain in contact with the component after assembly with the component. At least one of the deflectable members and the component has a thickness not greater than about 1000 microns.

Abstract: An apparatus including a micro-mechanical calibration member having at least a portion that is elastically biasable away from a neutral position in response to mechanical contact. The apparatus may also include a fixed member proximate the micro-mechanical calibration member which may be referenced to automatically detect deflection of the micro-mechanical calibration member away from the neutral position. The micro-mechanical calibration member may also be configured to receive a micro-mechanical contacting member to provide the mechanical contact employed to bias the micro-mechanical calibration member away from the neutral position.

Abstract: An apparatus including at least three deflectable members each configured to deflect during assembly with a component, and also configured to remain in contact with the component after assembly with the component. At least one of the deflectable members and the component has a thickness not greater than about 1000 microns.

Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.

Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.