Patents by Inventor Kenneth W. Deboe
Kenneth W. Deboe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240103068Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: November 29, 2023Publication date: March 28, 2024Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20240036103Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: October 12, 2023Publication date: February 1, 2024Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 11860221Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: January 12, 2022Date of Patent: January 2, 2024Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 11821940Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: March 1, 2023Date of Patent: November 21, 2023Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Publication number: 20230204651Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: March 1, 2023Publication date: June 29, 2023Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 11635459Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: November 10, 2021Date of Patent: April 25, 2023Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Publication number: 20220137121Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: January 12, 2022Publication date: May 5, 2022Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20220082636Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: November 22, 2021Publication date: March 17, 2022Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
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Publication number: 20220065921Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: November 10, 2021Publication date: March 3, 2022Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 11255903Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 29, 2020Date of Patent: February 22, 2022Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 11209497Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: GrantFiled: September 19, 2019Date of Patent: December 28, 2021Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
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Patent number: 11199572Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: March 26, 2020Date of Patent: December 14, 2021Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 10976362Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: June 11, 2020Date of Patent: April 13, 2021Assignee: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Publication number: 20210025935Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: September 29, 2020Publication date: January 28, 2021Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10852347Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 4, 2018Date of Patent: December 1, 2020Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20200300908Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: June 11, 2020Publication date: September 24, 2020Applicant: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Publication number: 20200233026Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: March 26, 2020Publication date: July 23, 2020Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 10718808Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: October 26, 2018Date of Patent: July 21, 2020Assignee: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Patent number: 10649022Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: February 27, 2018Date of Patent: May 12, 2020Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Publication number: 20200027799Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: September 19, 2019Publication date: January 23, 2020Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps