Patents by Inventor Kenneth Wei-An Mai

Kenneth Wei-An Mai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for generating reliable responses in physical unclonable functions (PUFs) and methods for designing strong PUFs
    Patent number: 10218517
    Abstract: In some aspects, a method includes obtaining, by a response generator circuit, reliability information for each bit of an array of bits provided by a physical unclonable function (PUF) circuit; receiving, from the PUF circuit during run time, an array of values for the array of bits; selecting a plurality of values from the array of values received from the PUF circuit in accordance with the reliability information; and generating, by the response generator circuit, a PUF response from the selected plurality of values.
    Type: Grant
    Filed: March 25, 2015
    Date of Patent: February 26, 2019
    Assignee: Carnegie Mellon University
    Inventors: Kenneth Wei-An Mai, Mudit Bhargava
  • Reliability of physical unclonable function circuits
    Patent number: 10038446
    Abstract: Techniques and circuits are disclosed for obtaining a physical unclonable function (PUF) circuit that is configured to provide, during a first operational mode, an output signal that is dependent on an electric characteristic of the PUF circuit. Techniques and circuits described herein can cause the PUF circuit to enter a second operational mode by applying a stress signal to the PUF circuit that changes a value of the electric characteristic relative to another value of the electric characteristic during the first operational mode of the PUF circuit; and adjusting, based on changing the absolute value of the first electric characteristic, a bias magnitude of the output signal relative to another bias magnitude of the output signal during the first operational mode of the PUF circuit.
    Type: Grant
    Filed: August 21, 2014
    Date of Patent: July 31, 2018
    Assignee: Carnegie Mellon University
    Inventors: Kenneth Wei-An Mai, Mudit Bhargava
  • METHODS FOR GENERATING RELIABLE RESPONSES IN PHYSICAL UNCLONABLE FUNCTIONS (PUFS) AND METHODS FOR DESIGNING STRONG PUFS
    Publication number: 20170180140
    Abstract: In some aspects, a method includes obtaining, by a response generator circuit, reliability information for each bit of an array of bits provided by a physical unclonable function (PUF) circuit; receiving, from the PUF circuit during run time, an array of values for the array of bits; selecting a plurality of values from the array of values received from the PUF circuit in accordance with the reliability information; and generating, by the response generator circuit, a PUF response from the selected plurality of values.
    Type: Application
    Filed: March 25, 2015
    Publication date: June 22, 2017
    Inventors: Kenneth Wei-An MAI, Mudit BHARGAVA
  • RELIABILITY OF PHYSICAL UNCLONABLE FUNCTION CIRCUITS
    Publication number: 20160182045
    Abstract: Techniques and circuits are disclosed for obtaining a physical unclonable function (PUF) circuit that is configured to provide, during a first operational mode, an output signal that is dependent on an electric characteristic of the PUF circuit. Techniques and circuits described herein can cause the PUF circuit to enter a second operational mode by applying a stress signal to the PUF circuit that changes a value of the electric characteristic relative to another value of the electric characteristic during the first operational mode of the PUF circuit; and adjusting, based on changing the absolute value of the first electric characteristic, a bias magnitude of the output signal relative to another bias magnitude of the output signal during the first operational mode of the PUF circuit.
    Type: Application
    Filed: August 21, 2014
    Publication date: June 23, 2016
    Inventors: Kenneth Wei-An Mai, Mudit Bhargava