Abstract: A closed loop delay line system (700) includes a phase lock loop that provides a phase lock output signal (715). A delay line (702) includes a clock input, a delay line output, and a delay line bias input. A bias signal provided to the delay line bias input (727) adjusts the speed of the delay line (702). A phase detector (720) compares phase between a first timing signal input (704) and the delay line output (706). A bias adjust circuit (726) mixes the phase compare output signal (725) and the phase lock output signal (715) to provide a combination bias signal (727) to the delay line (702). Additionally, the relative timing position of strobe outputs (734) from the delay line (702) can be individually adjusted.

Abstract: A closed loop delay line system (700) includes a phase lock loop that provides a phase lock output signal (715). A delay line (702) includes a clock input, a delay line output, and a delay line bias input. A bias signal provided to the delay line bias input (727) adjusts the speed of the delay line (702). A phase detector (720) compares phase between a first timing signal input (704) and the delay line output (706). A bias adjust circuit (726) mixes the phase compare output signal (725) and the phase lock output signal (715) to provide a combination bias signal (727) to the delay line (702). Additionally, the relative timing position of strobe outputs (734) from the delay line (702) can be individually adjusted.

Abstract: A closed loop delay line system (700) includes a phase lock loop that provides a phase lock output signal (715). A delay line (702) includes a clock input, a delay line output, and a delay line bias input. A bias signal provided to the delay line bias input (727) adjusts the speed of the delay line (702). A phase detector (720) compares phase between a first timing signal input (704) and the delay line output (706). A bias adjust circuit (726) mixes the phase compare output signal (725) and the phase lock output signal (715) to provide a combination bias signal (727) to the delay line (702). Additionally, the relative timing position of strobe outputs (734) from the delay line (702) can be individually adjusted.

Abstract: An analog-to-digital converter (ADC) (112) for sampling high speed video signals includes Pre-amplifiers (502, 504, 506) electrically coupled to Post-amplifiers (508, 510, 512) that are electrically coupled to output latches (514, 517, 519, 521, 523, 525, and 527). A sampling clock signal (116) clocks the output latches (514, 517, 519, 521, 523, 525, and 527) to sample an input analog electronic signal to provide a digital representation thereof. The ADC (112) includes an auto-zeroing function to cancel bias voltages at the Post-amplifiers (508, 510, 512) during a video signal horizontal blanking time period. The ADC (112) includes a bit dithering function by alternating sets of reference voltages into the Pre-amplifiers (502, 504, 506) increasing bit resolution. The ADC (112) includes wired interconnect interpolation between the Pre-amplifiers (502, 504, 506) and Post-amplifiers (508, 510, 512) and between the Post-amplifiers (508, 510, 512) and the output latches (514, 517, 519, 521, 523, 525, and 527).

Abstract: A low voltage differential signaling (“LVDS”) line driver includes a pre-emphasis circuit to increase the drive capability of the LVDS line driver. A current source provides a first drive current to a current steering circuit. The pre-emphasis circuit includes a second current source, a current sourcing circuit coupled to the second current source and the current steering circuit and a current sinking circuit coupled to the second current source and the current steering circuit. In this way, first and second drive currents are provided to during the switching of the signal states of an input signal, so that more drive current is supplied to the output of the LVDS line driver circuit. Thus, the time it takes for the current steering circuit to switch the drive current between the first and second directions is decreased.