Abstract: The described embodiments include a system for executing a load using a first processor and a seond processor in a computer system. During operation, a load balancer executing on the first processor obtains one or more attributes of a load to be executed on the computer system. Next, the load balancer applies a set of configurable rules to the one or more attributes to select a processor from the first and second processors for executing the load. Finally, the system executes the load on the selected processor.

Abstract: The described embodiments include a system for executing a load using a first processor and a second processor in a computer system. During operation, a load balancer executing on the first processor obtains one or more attributes of a load to be executed on the computer system. Next, the load balancer applies a set of configurable rules to the one or more attributes to select a processor from the first and second processors for executing the load. Finally, the system executes the load on the selected processor.

Abstract: A method for identifying faulty wafers includes processing a set of wafers in a tool; collecting tool state information during the processing of the set of wafers; generating a tool state information baseline; comparing the tool state information for each wafer to the tool state information baseline to identify any wafers with outlying tool state information; and designating a particular wafer in the set as suspect in response to identifying outlying tool state information for the particular wafer. A processing line includes a tool adapted to process a set of wafers, and a process controller.