Patents by Inventor Kent J. Gillig

Kent J. Gillig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Periodic field differential mobility analyzer
    Patent number: 9324552
    Abstract: A periodic field differential mobility analyzer apparatus for separating and identifying ionic analytes employs a series of elongated parallel channels, a pump, a first voltage providing an electric field Ex in a direction opposing the gas flow, a second voltage providing an electric field Ey in a direction perpendicular to the gas flow, an ion source, and a detector. The periodic field differential mobility analyzer provides high resolution and sensitivity.
    Type: Grant
    Filed: December 13, 2012
    Date of Patent: April 26, 2016
    Assignee: Academia Sinica
    Inventors: Kent J. Gillig, Chung-Hsuan Chen
  • Time-of-flight mass spectrometer for monitoring of fast processes
    Patent number: 7084395
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Grant
    Filed: October 18, 2004
    Date of Patent: August 1, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas F. Egan, Michael I. McCully, J. Albert Schultz
  • Time-of-flight mass spectrometer for monitoring of fast processes
    Patent number: 7019286
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Grant
    Filed: October 20, 2003
    Date of Patent: March 28, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
  • Mobility spectrometer
    Patent number: 6897437
    Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Additionally, novel combinations and configurations of components are used to simultaneously maintain a well defined ion packet and preserve sample throughput to the detector.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: May 24, 2005
    Assignee: Ionwerks
    Inventors: Katrin Fuhrer, Kent J. Gillig, Marc Gonin, David H. Russell, John A. Schultz
  • Time-of-flight mass spectrometer for monitoring of fast processes
    Publication number: 20040113064
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Application
    Filed: October 20, 2003
    Publication date: June 17, 2004
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
  • Time-of-flight mass spectrometer for monitoring of fast processes
    Patent number: 6683299
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: January 27, 2004
    Assignee: Ionwerks
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
  • Periodic field focusing ion mobility spectrometer
    Patent number: 6639213
    Abstract: This invention is generally in the field of improved ion mobility spectrometry. The improvement lies in the use of periodic focusing electric fields that minimize the spatial spread of the migrating ions by keeping them in a tight radius about the axis of travel. The resulting enhancement in sensitivity is accomplished without a concomitant loss in resolution as would normally be expected when non-linear fields are used.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: October 28, 2003
    Assignees: The Texas A & M University System, Ionwerks
    Inventors: Kent J. Gillig, David H. Russell
  • Time-of-flight mass spectrometer for monitoring of fast processes
    Publication number: 20030001087
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Application
    Filed: May 24, 2002
    Publication date: January 2, 2003
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
  • Mobility spectrometer
    Publication number: 20010032929
    Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Additionally, novel combinations and configurations of components are used to simultaneously maintain a well defined ion packet and preserve sample throughput to the detector.
    Type: Application
    Filed: February 28, 2001
    Publication date: October 25, 2001
    Inventors: Katrin Fuhrer, Kent J. Gillig, Marc Gonin, David H. Russell, John A. Schultz
  • Periodic field focusing ion mobility spectrometer
    Publication number: 20010032930
    Abstract: This invention is generally in the field of improved ion mobility spectrometry. The improvement lies in the use of periodic focusing electric fields that minimize the spatial spread of the migrating ions by keeping them in a tight radius about the axis of travel. The resulting enhancement in sensitivity is accomplished without a concomitant loss in resolution as would normally be expected when non-linear fields are used.
    Type: Application
    Filed: February 28, 2001
    Publication date: October 25, 2001
    Inventors: Kent J. Gillig, David H. Russell