Patents by Inventor Kent James GILLIG

Kent James GILLIG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11164735
    Abstract: The invention provides an ion mobility analyzer apparatus and analysis method. The analyzer apparatus includes an ion source, two groups of parallel electrodes, a power supply unit and a detector. The drift region is formed between the two groups of parallel electrodes, and has an ion entrance connected to the ion source and an ion exit. Each group of parallel electrodes is located in a plane respectively, and the two planes are parallel to each other. The power supply unit is configured to apply direct current potentials on the two groups of parallel electrodes to form a direct current electric field that applies an opposing force on ions against the gas flow so that ions with different mobilities are trapped under the combined effect of the gas flow and the direct current electric field. The detector is connected to the ion exit to detect ions.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: November 2, 2021
    Assignee: SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
    Inventors: Kent James Gillig, Keke Wang, Wenjian Sun, Xiaoqiang Zhang, Yupeng Cheng
  • Patent number: 10739308
    Abstract: The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: August 11, 2020
    Assignee: SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
    Inventors: Kent James Gillig, Keke Wang, Wenjian Sun, Xiaoqiang Zhang
  • Publication number: 20190164737
    Abstract: The invention provides an ion mobility analyzer apparatus and analysis method. The analyzer apparatus includes an ion source, two groups of parallel electrodes, a power supply unit and a detector. The drift region is formed between the two groups of parallel electrodes, and has an ion entrance connected to the ion source and an ion exit. Each group of parallel electrodes is located in a plane respectively, and the two planes are parallel to each other. The power supply unit is configured to apply direct current potentials on the two groups of parallel electrodes to form a direct current electric field that applies an opposing force on ions against the gas flow so that ions with different mobilities are trapped under the combined effect of the gas flow and the direct current electric field. The detector is connected to the ion exit to detect ions.
    Type: Application
    Filed: June 15, 2018
    Publication date: May 30, 2019
    Inventors: Kent James GILLIG, Keke WANG, Wenjian SUN, Xiaoqiang ZHANG, Yupeng CHENG
  • Publication number: 20190162698
    Abstract: The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.
    Type: Application
    Filed: June 15, 2018
    Publication date: May 30, 2019
    Inventors: Kent James GILLIG, Keke WANG, Wenjian SUN, Xiaoqiang ZHANG