Patents by Inventor Kent P. Fancher

Kent P. Fancher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for testing a memory embedded in an integrated circuit
    Patent number: 8531899
    Abstract: A memory system has a first memory having an array of memory cells that includes a redundant column. The redundant column substitutes for a first column in the array. The first column includes a test memory cell. The array receives a power supply voltage. The test memory cell becomes non-functional at a higher power supply voltage than the memory cells of the array. A memory controller is coupled to the first memory and is for determining if the test memory cell is functional at a first value for the power supply voltage. This is useful in making decisions concerning the value of the power supply voltage applied to the array.
    Type: Grant
    Filed: September 13, 2012
    Date of Patent: September 10, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Shayan Zhang, James D. Burnett, Kent P. Fancher, Andrew C. Russell, Michael D. Snyder
  • Integrated circuit having an embedded memory and method for testing the memory
    Patent number: 8379466
    Abstract: A memory system has a first memory having an array of memory cells that includes a redundant column. The redundant column substitutes for a first column in the array. The first column includes a test memory cell. The array receives a power supply voltage. The test memory cell becomes non-functional at a higher power supply voltage than the memory cells of the array. A memory controller is coupled to the first memory and is for determining if the test memory cell is functional at a first value for the power supply voltage. This is useful in making decisions concerning the value of the power supply voltage applied to the array.
    Type: Grant
    Filed: March 31, 2009
    Date of Patent: February 19, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Shayan Zhang, James D. Burnett, Kent P. Fancher, Andrew C. Russell, Michael D. Snyder
  • METHODS FOR TESTING A MEMORY EMBEDDED IN AN INTEGRATED CIRCUIT
    Publication number: 20130019133
    Abstract: A memory system has a first memory having an array of memory cells that includes a redundant column. The redundant column substitutes for a first column in the array. The first column includes a test memory cell. The array receives a power supply voltage. The test memory cell becomes non-functional at a higher power supply voltage than the memory cells of the array. A memory controller is coupled to the first memory and is for determining if the test memory cell is functional at a first value for the power supply voltage. This is useful in making decisions concerning the value of the power supply voltage applied to the array.
    Type: Application
    Filed: September 13, 2012
    Publication date: January 17, 2013
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Shayan Zhang, James D. Burnett, Kent P. Fancher, Andrew C. Russell, Micheal D. Snyder
  • INTEGRATED CIRCUIT HAVING AN EMBEDDED MEMORY AND METHOD FOR TESTING THE MEMORY
    Publication number: 20100246297
    Abstract: A memory system has a first memory having an array of memory cells that includes a redundant column. The redundant column substitutes for a first column in the array. The first column includes a test memory cell. The array receives a power supply voltage. The test memory cell becomes non-functional at a higher power supply voltage than the memory cells of the array. A memory controller is coupled to the first memory and is for determining if the test memory cell is functional at a first value for the power supply voltage. This is useful in making decisions concerning the value of the power supply voltage applied to the array.
    Type: Application
    Filed: March 31, 2009
    Publication date: September 30, 2010
    Inventors: Shayan Zhang, James D. Burnett, Kent P. Fancher, Andrew C. Russell, Michael D. Snyder