Patents by Inventor Kentaro Nishikata

Kentaro Nishikata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analyzer
    Patent number: 9170220
    Abstract: The X-ray analyzer repeats scanning of a sample by an electron beam from an electron gun (beam source), detects a characteristic X-ray from the sample by an X-ray detector, generates an element distribution image of the sample by a signal processor every scanning, and stores a plurality of element distribution images in a sequential order. Temporal changes of the element distribution image of the sample are obtained. Moreover, by moving a stage by a moving unit concurrently with the scanning, an element distribution image of the sample where the scanning position is varied is obtained. By generating the element distribution image while varying the scanning position, positioning of the range where the element distribution image is to be obtained on the sample can be quickly performed based on the element distribution image itself.
    Type: Grant
    Filed: December 5, 2012
    Date of Patent: October 27, 2015
    Assignee: HORIBA, LTD
    Inventors: Kentaro Nishikata, Satoshi Ohashi, Takashi Komatsubara
  • X-RAY ANALYZER
    Publication number: 20140326881
    Abstract: The X-ray analyzer repeats scanning of a sample by an electron beam from an electron gun (beam source), detects a characteristic X-ray from the sample by an X-ray detector, generates an element distribution image of the sample by a signal processor every scanning, and stores a plurality of element distribution images in a sequential order. Temporal changes of the element distribution image of the sample are obtained. Moreover, by moving a stage by a moving unit concurrently with the scanning, an element distribution image of the sample where the scanning position is varied is obtained. By generating the element distribution image while varying the scanning position, positioning of the range where the element distribution image is to be obtained on the sample can be quickly performed based on the element distribution image itself.
    Type: Application
    Filed: December 5, 2012
    Publication date: November 6, 2014
    Inventors: Kentaro Nishikata, Satoshi Ohashi, Takashi Komatsubara
  • Sample measuring device
    Patent number: 7589322
    Abstract: An object of this invention is to make it easy to adjust a position of the energy beam to irradiate and a position of a focal point of a light collecting mirror part, and to prevent displacement of the light collecting part due to vibration with a simple arrangement.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: September 15, 2009
    Assignee: Horiba, Ltd.
    Inventors: Kentaro Nishikata, Yutaka Saijo, Shigeru Kakinuma, Junichi Aoyama, Satoshi Ohashi
  • Sample measuring device
    Publication number: 20070023655
    Abstract: An object of this invention is to make it easy to adjust a position of the energy beam to irradiate and a position of a focal point of a light collecting mirror part, and to prevent displacement of the light collecting part due to vibration with a simple arrangement.
    Type: Application
    Filed: June 28, 2006
    Publication date: February 1, 2007
    Inventors: Kentaro Nishikata, Yutaka Saijo, Shigeru Kakinuma, Junichi Aoyama, Satoshi Ohashi