Patents by Inventor Kentaro Osawa

Kentaro Osawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200308530
    Abstract: Provided is a method for non-invasively and quantitatively determining multilayerization and differentiation when culturing a cell sheet. Provided is a method for determining a cell state by imaging a cell sheet by using an optical instrument characterized by having a high resolution, and then analyzing the inner structure thereof.
    Type: Application
    Filed: June 12, 2020
    Publication date: October 1, 2020
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Naoko Senda, Kentaro Osawa
  • Patent number: 10746528
    Abstract: Exemplary embodiments relate to providing an optical image measurement apparatus that is capable of acquiring information on birefringence of a sample while suppressing size and cost of the apparatus. In the present disclosure: second measurement light different from first measurement light is generated using a passive optical element that generates light of second polarization state different from first polarization state; a time when the first measurement light is irradiated onto a sample is adjusted at a first time, and a time when the second measurement light is irradiated onto the sample is adjusted at a second time different from the first time.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: August 18, 2020
    Assignee: HITACHI-LG DATA STORAGE, INC.
    Inventor: Kentaro Osawa
  • Patent number: 10717962
    Abstract: Provided is a method for non-invasively and quantitatively determining multilayerization and differentiation when culturing a cell sheet. Provided is a method for determining a cell state by imaging a cell sheet by using an optical instrument characterized by having a high resolution, and then analyzing the inner structure thereof.
    Type: Grant
    Filed: June 22, 2015
    Date of Patent: July 21, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Naoko Senda, Kentaro Osawa
  • Publication number: 20190072375
    Abstract: An optical image measuring apparatus according to the present invention includes an optical branching unit that branches light emitted from a light source into a signal light and a reference light, and an optical scanning unit that scans an angle of an optical axis emitted from the light source is disposed between the light source and the optical branching unit.
    Type: Application
    Filed: June 18, 2018
    Publication date: March 7, 2019
    Inventor: Kentaro OSAWA
  • Patent number: 10041874
    Abstract: An objective of the present invention is to provide a technique for reducing measurement errors when measuring specimen using light. An aspect of an optical measurement method according to the present invention: acquires relationship data that describes a relationship between an intensity of reflection light when irradiating light onto a specimen and a size of the specimen; and acquires the size of the specimen using the relationship data and the intensity of the reflection light. Another aspect of an optical measurement method according to the present invention subtracts a component due to an inclination of a vessel of a specimen from a detection signal representing an intensity of reflection light when irradiating light onto the specimen, thereby correcting the inclination of the vessel.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: August 7, 2018
    Assignee: Hitachi-LG Data Storage, Inc.
    Inventors: Hiroyuki Minemura, Kentaro Osawa, Yumiko Anzai
  • Patent number: 10006755
    Abstract: By utilizing the fact that the observation object has a three-dimensional shape and the boundary surface can be regarded as a plane surface, phase or intensity distribution is applied into a luminous flux of reference light, thereby selectively attenuating the influence of the reflected light from the boundary surface so as to obtain a high-quality OCT image.
    Type: Grant
    Filed: January 8, 2016
    Date of Patent: June 26, 2018
    Assignee: Hitachi-LG Data Storage, Inc.
    Inventors: Hiroyuki Minemura, Kentaro Osawa
  • Publication number: 20180120084
    Abstract: Exemplary embodiments relate to providing an optical image measurement apparatus that is capable of acquiring information on birefringence of a sample while suppressing size and cost of the apparatus. In the present disclosure: second measurement light different from first measurement light is generated using a passive optical element that generates light of second polarization state different from first polarization state; a time when the first measurement light is irradiated onto a sample is adjusted at a first time, and a time when the second measurement light is irradiated onto the sample is adjusted at a second time different from the first time.
    Type: Application
    Filed: October 16, 2017
    Publication date: May 3, 2018
    Inventor: Kentaro OSAWA
  • Patent number: 9772178
    Abstract: Provided is an optical measuring device that can realize a wide measurement region without an increase in the measurement time or a reduction in the measurement region while avoiding damage to a measurement target due to excessive light exposure, using a simple configuration. The device includes a light source, an optical splitting unit configured to split a light beam emitted from the light source into a signal beam and a reference beam, an objective lens configured to focus the signal beam and irradiate a measurement target with the signal beam, a scanning unit configured to move the focus position of the signal beam, an optical element having lower transmissivity in its peripheral portion than in its central portion, interference optics configured to combine the reference beam with the signal beam reflected or scattered by the measurement target, thereby generating interference beams, and photodetectors configured to detect the respective interference beams.
    Type: Grant
    Filed: July 13, 2016
    Date of Patent: September 26, 2017
    Assignee: Hitachi-LG Data Storage, Inc.
    Inventors: Kentaro Osawa, Hiroyuki Minemura, Yumiko Anzai
  • Patent number: 9759545
    Abstract: A luminous flux including laser light of different wavelengths outgoing from a light source unit is split into two luminous fluxes, the first luminous flux is focused on a sample with an objective lens, and the second luminous flux functions as reference light without radiating it onto the sample. Signal light reflected from the sample and the reference light are multiplexed by a polarized beam splitter and are made to interfere on four photodetectors out of phase in a photodetection unit. A signal processing unit acquires the optical axis distribution of an object in the sample by using the outputs of the plural photodetectors for every input wavelength, acquiring a detection signal and calculating the ratio of intensities of the detection signals at the different input wavelengths for every position in the sample.
    Type: Grant
    Filed: November 19, 2013
    Date of Patent: September 12, 2017
    Assignee: HITACHI-LG DATA STORAGE, INC.
    Inventors: Masaki Mukoh, Kentaro Osawa, Tatsuro Ide
  • Publication number: 20170159004
    Abstract: Provided is a method for non-invasively and quantitatively determining multilayerization and differentiation when culturing a cell sheet. Provided is a method for determining a cell state by imaging a cell sheet by using an optical instrument characterized by having a high resolution, and then analyzing the inner structure thereof.
    Type: Application
    Filed: June 22, 2015
    Publication date: June 8, 2017
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Naoko Senda, Kentaro Osawa
  • Publication number: 20170160185
    Abstract: An objective of the present invention is to provide a technique for reducing measurement errors when measuring specimen using light. An aspect of an optical measurement method according to the present invention: acquires relationship data that describes a relationship between an intensity of reflection light when irradiating light onto a specimen and a size of the specimen; and acquires the size of the specimen using the relationship data and the intensity of the reflection light. Another aspect of an optical measurement method according to the present invention subtracts a component due to an inclination of a vessel of a specimen from a detection signal representing an intensity of reflection light when irradiating light onto the specimen, thereby correcting the inclination of the vessel.
    Type: Application
    Filed: November 15, 2016
    Publication date: June 8, 2017
    Inventors: Hiroyuki MINEMURA, Kentaro OSAWA, Yumiko ANZAI
  • Patent number: 9658054
    Abstract: Provided is a compact, low-cost optical measuring apparatus capable of acquiring an image of a target to be measured without moving a mirror or using a wavelength-scanning light source or beam splitter. A laser beam emitted from a light source is split into first and second beams, and the first beam is focused as a signal beam onto the target by a lens for irradiation purposes, while the second beam is reflected as a reference beam by a mirror without irradiating the target. Then, a signal beam reflected by or scattered by the target is multiplexed with the reference beam and then enters interference optics, whereby three or more interference beams with different phases are generated and detected by photodetectors. Then, the detection signals are operated by a signal processing unit. During the measurement, the focus position of the first beam is moved at least in the optical axis direction.
    Type: Grant
    Filed: November 8, 2013
    Date of Patent: May 23, 2017
    Assignee: HITACHI-LG DATA STORAGE, INC.
    Inventors: Kentaro Osawa, Koichi Watanabe, Daisuke Tomita
  • Patent number: 9638510
    Abstract: An optical measurement apparatus has a light source that emits a laser beam that is branched into signal light and reference light. An objective lens condenses the signal light on a measurement target to cause the measurement target to be irradiated; and a condensing position of the signal light is scanned in an optical axis direction. An interference optical system combines the signal light reflected or scattered from the measurement target with the reference light, and generates a plurality of interfering light beams having phase relationships different from one another that are detected by photodetectors. The detection signals are output as electrical signals; and a signal processing unit performs a predetermined arithmetic operation on the plurality of detection signals. The signal processing unit subtracts reflection light components from a predetermined portion of the measurement target from the plurality of detection signals or signals generated using the detection signals.
    Type: Grant
    Filed: February 3, 2015
    Date of Patent: May 2, 2017
    Assignee: HITACHI—LG DATA STORAGE, INC.
    Inventors: Kentaro Osawa, Naoko Senda, Daisuke Tomita
  • Patent number: 9625389
    Abstract: To measure a surface state, reflective CARS is suitable in terms of the signal intensity. However, with the reflective CARS, it has been difficult to identify the surface position because the shape information is not acquired. Thus, a reflective CARS microscope is combined with a high-resolution phase sensor. The surface position is identified with the phase sensor, and reflected CARS generated from the surface is detected, so that composition analysis is performed.
    Type: Grant
    Filed: September 22, 2014
    Date of Patent: April 18, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Manabu Shiozawa, Koichi Watanabe, Masataka Shirai, Kentaro Osawa
  • Patent number: 9625380
    Abstract: There is provided an optical tomographic observation device which has a resolving power which is higher than those of a conventional optical tomographic observation device and a confocal microscope by a simple configuration by applying a homodyne phase diversity detection technology and designing so as to satisfy the following formula when ? is a wavelength of a laser light source, ?? is a wavelength half width at half maximum, NA is a numerical aperture of an objective optical element, S is an effective area of a photodetector, and M is a detection magnification of a detection surface relative to a condensing surface. 1 NA 2 ? k 1 0.886 ? ? ?? ? ( NA ? 1 - NA 2 ) ? 0.901 ? S M 2 0.441 ? k 1 ? 0.
    Type: Grant
    Filed: September 4, 2013
    Date of Patent: April 18, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Masaki Mukoh, Tatsuro Ide, Kentaro Osawa
  • Patent number: 9593935
    Abstract: A clear image of a measurement target in optical coherence tomography (OCT) is obtained while suppressing influence of reflected light from a specific portion. Included are a laser beam source, a beam splitter that splits a laser beam into a signal beam and reference beam; an objective lens that focuses the signal beam onto a measurement target in a container, a unit that moves the signal beam focus position, an objective lens that focuses the reference beam, a reflecting mirror, a flat plate arranged between the objective lens and reflecting mirror, and interference optics that combine the signal beam reflected by the measurement target with the reference beam reflected by the reflecting mirror and having passed through the objective lens. Three or more interference beams with different phases, and photodetectors that detect the interference beams are generated, and two of the objective lenses are the same lenses.
    Type: Grant
    Filed: July 9, 2015
    Date of Patent: March 14, 2017
    Assignee: Hitachi-LG Data Storage, Inc.
    Inventors: Kentaro Osawa, Naoko Senda, Daisuke Tomita
  • Publication number: 20170059300
    Abstract: Provided is an optical measuring device that can realize a wide measurement region without an increase in the measurement time or a reduction in the measurement region while avoiding damage to a measurement target due to excessive light exposure, using a simple configuration. The device includes a light source, an optical splitting unit configured to split a light beam emitted from the light source into a signal beam and a reference beam, an objective lens configured to focus the signal beam and irradiate a measurement target with the signal beam, a scanning unit configured to move the focus position of the signal beam, an optical element having lower transmissivity in its peripheral portion than in its central portion, interference optics configured to combine the reference beam with the signal beam reflected or scattered by the measurement target, thereby generating interference beams, and photodetectors configured to detect the respective interference beams.
    Type: Application
    Filed: July 13, 2016
    Publication date: March 2, 2017
    Inventors: Kentaro OSAWA, Hiroyuki MINEMURA, Yumiko ANZAI
  • Publication number: 20160299080
    Abstract: To measure a surface state, reflective CARS is suitable in terms of the signal intensity. However, with the reflective CARS, it has been difficult to identify the surface position because the shape information is not acquired. Thus, a reflective CARS microscope is combined with a high-resolution phase sensor. The surface position is identified with the phase sensor, and reflected CARS generated from the surface is detected, so that composition analysis is performed.
    Type: Application
    Filed: September 22, 2014
    Publication date: October 13, 2016
    Inventors: Manabu SHIOZAWA, Koichi WATANABE, Masataka SHIRAI, Kentaro OSAWA
  • Publication number: 20160265899
    Abstract: By utilizing the fact that the observation object has a three-dimensional shape and the boundary surface can be regarded as a plane surface, phase or intensity distribution is applied into a luminous flux of reference light, thereby selectively attenuating the influence of the reflected light from the boundary surface so as to obtain a high-quality OCT image.
    Type: Application
    Filed: January 8, 2016
    Publication date: September 15, 2016
    Inventors: Hiroyuki Minemura, Kentaro Osawa
  • Patent number: 9441950
    Abstract: A small and inexpensive optical measurement apparatus is provided in which noise due to optical interference such as inter-layer crosstalk or speckle is suppressed.
    Type: Grant
    Filed: February 25, 2014
    Date of Patent: September 13, 2016
    Assignee: HITACHI-LG DATA STORAGE, INC.
    Inventors: Kentaro Osawa, Daisuke Tomita, Masaki Muko