Patents by Inventor Kentaro Tezuka

Kentaro Tezuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240361236
    Abstract: Various characteristics in laser absorption spectroscopy using multiple reflections are improved. A gas measurement apparatus 1 according to the present disclosure measures a gas concentration by laser absorption spectroscopy. The gas measurement apparatus 1 includes a first corner cube 10, a second corner cube 20 disposed opposite the first corner cube 10, a laser source 30 that emits a laser beam to the first corner cube 10, and a light receiving element 40 that receives the laser beam that has been reflected multiple times through a target gas between the first and second corner cubes 10 and 20. The second corner cube 20 is disposed so that a centerline parallel to incident and exit light centering at incident and exit positions of the first corner cube 10 is displaced from a centerline parallel to incident and exit light centering at incident and exit positions of the second corner cube 20.
    Type: Application
    Filed: April 16, 2024
    Publication date: October 31, 2024
    Applicant: Yokogawa Electric Corporation
    Inventors: Yasuo Sakamaki, Yumiko Sugiyama, Kentaro Tezuka, Shigeo Uneme, Saki Kobako
  • Publication number: 20080226295
    Abstract: A light modulating apparatus which is to be used in a transmission system using wavelength division multiplexing has: a signal generating section for producing a transmission signal and the like; a first light modulating section for modulating light emitted from a light source, on the basis of the transmission signal; a variable phase shifter which changes a phase of a light quantity control signal; a second light modulating section for modulating a light signal emitted from the first light modulating section, on the basis of an output of the variable phase shifter; a branching section for branching a light signal emitted from the second light modulating section, into an output light signal and an electric signal; and an analysis controlling section for sampling the electric signal, controlling the variable phase shifter on the basis of sampled data, and adjusting a timing of the modulation in the second light modulating section.
    Type: Application
    Filed: November 26, 2007
    Publication date: September 18, 2008
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Akira MIURA, Kenji UCHIDA, Masahiro IZUKA, Hirotoshi KODAKA, Tsuyoshi YAKIHARA, Katsuya IKEZAWA, Daisuke TANIMURA, Chie SATO, Kentaro TEZUKA, Morio WADA
  • Publication number: 20080001641
    Abstract: A phase control circuit includes: a variable delay circuit for delaying a clock signal; a first flip-flop circuit having a clock input terminal to which the delayed clock signal is input and a data input terminal to which a data signal is input; a second flip-flop circuit having a clock input terminal to which the data signal is input and a data input terminal to which the delayed clock signal is input; and an integration circuit for controlling a delay amount of the variable delay circuit based on an output signal of the second flip-flop circuit.
    Type: Application
    Filed: February 2, 2007
    Publication date: January 3, 2008
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Kenji Uchida, Akira Miura, Hirotoshi Kodaka, Tsuyoshi Yakihara, Daisuke Tanimura, Kentaro Tezuka, Kentaro Butatsu
  • Patent number: 7307432
    Abstract: An optical sampling apparatus has an electron beam generating apparatus which generates an electron beam by irradiating a cathode with an optical signal, a deflection electrode which deflects the generated electron beam, a sampling slit which transmits a part of the deflected electron beam, and a charge detection section which detects the quantity of charges or accumulated current of the transmitted electron beam. It is possible to perform accurate sampling in a high band.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: December 11, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Kentaro Tezuka, Tsuyoshi Yakihara, Sadaharu Oka, Shinji Kobayashi, Akira Miura
  • Publication number: 20050134297
    Abstract: An optical sampling apparatus has an electron beam generating apparatus which generates an electron beam by irradiating a cathode with an optical signal, a deflection electrode which deflects the generated electron beam, a sampling slit which transmits a part of the deflected electron beam, and a charge detection section which detects the quantity of charges or accumulated current of the transmitted electron beam. It is possible to perform accurate sampling in a high band.
    Type: Application
    Filed: December 1, 2004
    Publication date: June 23, 2005
    Inventors: Kentaro Tezuka, Tsuyoshi Yakihara, Sadaharu Oka, Shinji Kobayashi, Akira Miura