Patents by Inventor Kentaro TOKURA

Kentaro TOKURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230401356
    Abstract: Provided are a construction information integration system, a construction information integration method, and a construction information integration program that properly support the automated operation of a crane. The construction information integration system 100 manages the automated operation of a crane and includes an architectural information acquiring unit 110 that acquires architectural information including information related to a design, a construction member, and a construction plan of a building to be constructed, a plan information generation unit 120 that generates, on the basis of the architectural information, first plan information including at least installation coordinates and order of installation for the construction member, and a transmission unit 130 that transmits the first plan information to a machine body control system 20 provided as a separate system from the construction information integration system 100 to control the operation of the crane.
    Type: Application
    Filed: March 8, 2021
    Publication date: December 14, 2023
    Inventors: Sho TAGO, Kazuhito SUGAYA, Takashi SUGIMOTO, Masatoshi SOMEYA, Kentaro TOKURA
  • Patent number: 10977825
    Abstract: [Problem] To enable three-dimensional measurement with good precision. [Solution] When three-dimensional measurement is to be performed with good precision using SLAM or the like, images of marks M1, M2, M3, M4 must be captured from various directions by a single-lens camera. In the present invention, directions of imaging by a camera are displayed as sectors C1, C2, C3, C4. For example, it is understood that whereas sectors C1 and C4 have a large central angle and imaging therein is performed from a wide range of directions, sectors C2 and C3 have a small central angle and imaging therein is performed from a narrow range of directions. A photographer seeing such a display can perform additional imaging, and images can therefore be obtained from a wide range of directions, and three-dimensional measurement can be performed with good precision.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: April 13, 2021
    Assignees: SUMITOMO MITSUI CONSTRUCTION CO., LTD., KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
    Inventors: Kentaro Tokura, Naoki Nagamoto, Takao Kakehashi, Motohiro Ikehara, Hideaki Uchiyama
  • Patent number: 10816320
    Abstract: [Problem] When inspecting whether each sleeve is in the correct position, to alleviate the burden on an operator and reduce the inspection time. [Solution] When an operator captures an image of a reference marker 3 or a sleeve marker 4 using a camera C, the image is sent to a sleeve marker position analyzing means 5 for the position of each sleeve marker 4, . . . to be analyzed. Then, a sleeve marker position assessing means 6 assesses whether the position of each sleeve marker 4, . . . is suitable, by superimposing the resulting analysis data and a BIM model stored in a BIM model storage means 2. Since it is sufficient for the operator to capture an image of the reference marker 3 or the sleeve marker 4 using the camera C, the burden on the operator can be alleviated, and the inspection time can also be reduced.
    Type: Grant
    Filed: October 4, 2017
    Date of Patent: October 27, 2020
    Assignee: SUMITOMO MITSUI CONSTRUCTION CO., LTD.
    Inventors: Kentaro Tokura, Naoki Nagamoto, Takao Kakehashi, Motohiro Ikehara, Hideaki Uchiyama
  • Publication number: 20200025553
    Abstract: [Problem] When inspecting whether each sleeve is in the correct position, to alleviate the burden on an operator and reduce the inspection time. [Solution] When an operator captures an image of a reference marker 3 or a sleeve marker 4 using a camera C, the image is sent to a sleeve marker position analyzing means 5 for the position of each sleeve marker 4, . . . to be analyzed. Then, a sleeve marker position assessing means 6 assesses whether the position of each sleeve marker 4, . . . is suitable, by superimposing the resulting analysis data and a BIM model stored in a BIM model storage means 2. Since it is sufficient for the operator to capture an image of the reference marker 3 or the sleeve marker 4 using the camera C, the burden on the operator can be alleviated, and the inspection time can also be reduced.
    Type: Application
    Filed: October 4, 2017
    Publication date: January 23, 2020
    Applicants: SUMITOMO MITSUI CONSTRUCTION CO., LTD., KYUSHU UNIVERISTY, NATIONAL UNIVERSITY CORPORATION
    Inventors: Kentaro TOKURA, Naoki NAGAMOTO, Takao KAKEHASHI, Motohiro IKEHARA, Hideaki UCHIYAMA
  • Publication number: 20190378299
    Abstract: [Problem] To enable three-dimensional measurement with good precision. [Solution] When three-dimensional measurement is to be performed with good precision using SLAM or the like, images of marks M1, M2, M3, M4 must be captured from various directions by a single-lens camera. In the present invention, directions of imaging by a camera are displayed as sectors C1, C2, C3, C4. For example, it is understood that whereas sectors C1 and C4 have a large central angle and imaging therein is performed from a wide range of directions, sectors C2 and C3 have a small central angle and imaging therein is performed from a narrow range of directions. A photographer seeing such a display can perform additional imaging, and images can therefore be obtained from a wide range of directions, and three-dimensional measurement can be performed with good precision.
    Type: Application
    Filed: January 30, 2018
    Publication date: December 12, 2019
    Applicants: SUMITOMO MITSUI CONSTRUCTION CO., LTD., KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
    Inventors: Kentaro TOKURA, Naoki NAGAMOTO, Takao KAKEHASHI, Motohiro IKEHARA, Hideaki UCHIYAMA