Patents by Inventor Kentaro Tsuchihashi
Kentaro Tsuchihashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10942154Abstract: According to embodiments, an ultrasonic inspection apparatus comprises: an ultrasonic array probe having a plurality of ultrasonic elements; an estimated shape reflected wave arrival time calculator for computing the estimated shape reflected wave arrival time for the estimated shape reflected wave on the basis of the estimated sound velocity in the test object; an actual shape reflected wave arrival time extractor for extracting the actual shape reflected wave arrival time on the basis of the actual shape reflected wave; a shape reflected waves time difference calculator for computing the difference by subtracting the actual shape reflected wave arrival time from the estimated shape reflected wave arrival time as shape reflected waves time difference; and a delay time calculator for computing the delay times for mutually shifting the timings of ultrasonic wave transmission and ultrasonic wave reception by the ultrasonic elements, considering the shape reflected waves time differences.Type: GrantFiled: February 7, 2019Date of Patent: March 9, 2021Assignees: KABUSHIKl KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Setsu Yamamoto, Jun Semboshi, Azusa Sugawara, Kentaro Tsuchihashi, Masaru Otsuka
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Patent number: 10895557Abstract: According to an embodiment, a linear-scan ultrasonic inspection apparatus comprises: an ultrasonic array probe having ultrasonic elements aligned in a first direction; a delay-time calculator configured to calculate, referring to the surface shape of the test object, values of delay time of at least one of transmitting and receiving ultrasonic wave; an overlapping-region adjustor configured to set conditions for generating an image of an overlapping region; and an integrated-image generator configured to generate first image data of a region including the overlapping region. The overlapping-region adjustor is configured to set the conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe setting position or the second-probe setting position as both of a first acquired shape obtained at the first-probe setting position and a second acquired shape obtained at the second-probe setting position.Type: GrantFiled: August 24, 2018Date of Patent: January 19, 2021Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions CorporationInventors: Setsu Yamamoto, Azusa Sugawara, Jun Semboshi, Kentaro Tsuchihashi, Masaru Otsuka
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Patent number: 10718741Abstract: An ultrasonic flaw detecting apparatus comprises an array prove, an element-group defining circuit, a calculator, a signal receiver and a generator. The array probe comprises a plurality of piezoelectric elements, each of the plurality of piezoelectric elements being configured to transmit and receive an ultrasonic wave to and from an inspection object. The element-group defining circuit is configured to select, as an element group, plural consecutive piezoelectric elements from the plurality of piezoelectric elements, set a reference position of the element group based on array arrangement information of the plurality of piezoelectric elements in the element group and based on a weighting value of each of the plurality of piezoelectric elements in the element group, and calculate a propagation path of an ultrasonic beam from the element group based on the reference position and a predetermined refraction angle.Type: GrantFiled: March 23, 2018Date of Patent: July 21, 2020Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions CorporationInventors: Setsu Yamamoto, Azusa Sugawara, Jun Semboshi, Kentaro Tsuchihashi, Takeshi Hoshi, Masaru Otsuka
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Publication number: 20190242858Abstract: According to embodiments, an ultrasonic inspection apparatus comprises: an ultrasonic array probe having a plurality of ultrasonic elements; an estimated shape reflected wave arrival time calculator for computing the estimated shape reflected wave arrival time for the estimated shape reflected wave on the basis of the estimated sound velocity in the test object; an actual shape reflected wave arrival time extractor for extracting the actual shape reflected wave arrival time on the basis of the actual shape reflected wave; a shape reflected waves time difference calculator for computing the difference by subtracting the actual shape reflected wave arrival time from the estimated shape reflected wave arrival time as shape reflected waves time difference; and a delay time calculator for computing the delay times for mutually shifting the timings of ultrasonic wave transmission and ultrasonic wave reception by the ultrasonic elements, considering the shape reflected waves time differences.Type: ApplicationFiled: February 7, 2019Publication date: August 8, 2019Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Setsu YAMAMOTO, Jun SEMBOSHI, Azusa SUGAWARA, Kentaro TSUCHIHASHI, Masaru OTSUKA
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Publication number: 20190170701Abstract: An ultrasonic flaw detecting apparatus comprises an array prove, an element-group defining circuit, a calculator, a signal receiver and a generator. The array probe comprises a plurality of piezoelectric elements, each of the plurality of piezoelectric elements being configured to transmit and receive an ultrasonic wave to and from an inspection object. The element-group defining circuit is configured to select, as an element group, plural consecutive piezoelectric elements from the plurality of piezoelectric elements, set a reference position of the element group based on array arrangement information of the plurality of piezoelectric elements in the element group and based on a weighting value of each of the plurality of piezoelectric elements in the element group, and calculate a propagation path of an ultrasonic beam from the element group based on the reference position and a predetermined refraction angle.Type: ApplicationFiled: March 23, 2018Publication date: June 6, 2019Applicants: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions CorporationInventors: Setsu YAMAMOTO, Azusa SUGAWARA, Jun SEMBOSHI, Kentaro TSUCHIHASHI, Takeshi HOSHI, Masaru OTSUKA
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Publication number: 20190064120Abstract: According to an embodiment, a linear-scan ultrasonic inspection apparatus comprises: an ultrasonic array probe having ultrasonic elements aligned in a first direction; a delay-time calculator configured to calculate, referring to the surface shape of the test object, values of delay time of at least one of transmitting and receiving ultrasonic wave; an overlapping-region adjustor configured to set conditions for generating an image of an overlapping region; and an integrated-image generator configured to generate first image data of a region including the overlapping region. The overlapping-region adjustor is configured to set the conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe setting position or the second-probe setting position as both of a first acquired shape obtained at the first-probe setting position and a second acquired shape obtained at the second-probe setting position.Type: ApplicationFiled: August 24, 2018Publication date: February 28, 2019Applicants: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions CorporationInventors: Setsu YAMAMOTO, Azusa SUGAWARA, Jun SEMBOSHI, Kentaro TSUCHIHASHI, Masaru OTSUKA
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Patent number: 8497986Abstract: A laser maintenance apparatus including a laser irradiation device which includes a first optical element for irradiating detection laser light on a test object to detect an ultrasonic wave; a second optical element for irradiating generation laser light on a test object so as to excite the ultrasonic wave; and an optical system container for containing the first and second optical element. The reflection direction of the first optical element and the reflection direction of the second optical element are arranged at an angle along the circumferential direction of the test object. The light reflected by the first optical element is irradiated at a position different than light reflected by the second optical element, and the laser irradiation positions of the light reflected by the first and second optical elements are different in the axial direction and the circumferential direction of the test object.Type: GrantFiled: April 23, 2010Date of Patent: July 30, 2013Assignee: Kabushiki Kaisha ToshibaInventors: Makoto Ochiai, Takahiro Miura, Mitsuaki Shimamura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida
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Patent number: 8248595Abstract: A surface inspecting method including irradiating a laser light to a test object to generate an ultrasonic wave, irradiating a second laser light at a position apart by a known distance from a position where the laser light is irradiated and receiving a reflection light thereof, and correcting a generation surface wave of a received ultrasonic wave by using an ultrasonic wave other than the generation surface wave to thereby detect a flaw of the test object. A characterization of the generation surface wave is divided or integrated by the same characterization of the ultrasonic wave other than the generation surface wave included in an output signal to obtain a performance index value and obtain a depth of the flaw by applying the performance index value to a calibration curve in which a corresponding relation between the performance index value and the depth of the flaw is obtained preliminarily.Type: GrantFiled: September 19, 2011Date of Patent: August 21, 2012Assignee: Kabushiki Kaisha ToshibaInventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
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Publication number: 20120048021Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.Type: ApplicationFiled: September 19, 2011Publication date: March 1, 2012Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
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Patent number: 8115936Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.Type: GrantFiled: April 23, 2010Date of Patent: February 14, 2012Assignee: Kabushiki Kaisha ToshibaInventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
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Patent number: 8094297Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.Type: GrantFiled: April 23, 2010Date of Patent: January 10, 2012Assignee: Kabushiki Kaisha ToshibaInventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
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Publication number: 20100208248Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.Type: ApplicationFiled: April 23, 2010Publication date: August 19, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Makoto OCHIAI, Takahiro Miura, Mitsuaki Shimamura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida
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Publication number: 20100199769Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.Type: ApplicationFiled: April 23, 2010Publication date: August 12, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Makoto OCHIAI, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
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Publication number: 20100199768Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.Type: ApplicationFiled: April 23, 2010Publication date: August 12, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
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Patent number: 7728967Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.Type: GrantFiled: July 6, 2006Date of Patent: June 1, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Makoto Ochiai, Yoshiaki Ono, Takahiro Miura, Mitsuaki Shimamura, Masaki Yoda, Hidehiko Kuroda, Itaru Chida, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Ryoichi Saeki
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Publication number: 20070157730Abstract: A laser maintenance apparatus is provided with a laser system including a laser light source and an optical system and emitting a laser light, a light transmitting device for generating the laser light emitted from the laser system, and a laser irradiation device for irradiating the laser light generated by the light transmitting device to an object portion. The laser system includes an element for changing an irradiation condition of the laser light.Type: ApplicationFiled: July 6, 2006Publication date: July 12, 2007Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Makoto Ochiai, Yoshiaki Ono, Takahiro Miura, Mitsuaki Shimamura, Masaki Yoda, Hidehiko Kuroda, Itaru Chida, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Ryoichi Saeki, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki