Patents by Inventor Kentarou Sekino

Kentarou Sekino has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8183878
    Abstract: An electrical testing device has a first probe that electrically contacts with an inspection device, a second probe that is electrically connected to the first probe and electrically contacts with an external terminal of a test object, a cylinder that houses the first probe and second probe, and into which and out of which a fluid flows between the first probe and second probe, and a fluid pressure regulator that controls the fluid pressure in the cylinder. The fluid pressure in the cylinder controls the contact force between the first probe and the inspection device and the contact force between the second probe and the external terminal.
    Type: Grant
    Filed: January 22, 2010
    Date of Patent: May 22, 2012
    Assignee: Renesas Electronics Corporation
    Inventor: Kentarou Sekino
  • Publication number: 20100182029
    Abstract: An electrical testing device has a first probe that electrically contacts with an inspection device, a second probe that is electrically connected to the first probe and electrically contacts with an external terminal of a test object, a cylinder that houses the first probe and second probe, and into which and out of which a fluid flows between the first probe and second probe, and a fluid pressure regulator that controls the fluid pressure in the cylinder. The fluid pressure in the cylinder controls the contact force between the first probe and the inspection device and the contact force between the second probe and the external terminal.
    Type: Application
    Filed: January 22, 2010
    Publication date: July 22, 2010
    Applicant: NEC Electronics Corporation
    Inventor: Kentarou SEKINO