Patents by Inventor Kento AIZAWA
Kento AIZAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11898908Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.Type: GrantFiled: November 3, 2022Date of Patent: February 13, 2024Assignee: JASCO CORPORATIONInventors: Masateru Usuki, Yoshiko Kubo, Daisuke Dogomi, Kento Aizawa, Tsutomu Inoue
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Publication number: 20230145637Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.Type: ApplicationFiled: November 3, 2022Publication date: May 11, 2023Applicant: JASCO CORPORATIONInventors: Masateru USUKI, Yoshiko KUBO, Daisuke DOGOMI, Kento AIZAWA, Tsutomu INOUE
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Patent number: 11635605Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.Type: GrantFiled: February 5, 2020Date of Patent: April 25, 2023Assignee: JASCO CorporationInventors: Kento Aizawa, Yoshiko Kubo, Norihito Fujiwara, Katsunori Morii
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Patent number: 11579089Abstract: A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.Type: GrantFiled: December 11, 2020Date of Patent: February 14, 2023Assignee: JASCO CORPORATIONInventors: Kento Aizawa, Takeo Soejima, Tsutomu Inoue
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Patent number: 11248962Abstract: A method of analyzing foreign matter in a sample includes: measuring an optical spectrum for each of a plurality of measurement points of a measurement region on the sample by a microscopic spectroscope; calculating a feature value of each measured spectrum by a computer; determining whether each of the measurement points is on the foreign matter or not based on each feature value; retaining the spectrum of the measurement point that is determined to be on the foreign matter, and deleting the spectrum of the measurement point that is not determined to be on the foreign matter or storing the same to a storage unit; and executing multivariate analysis of the spectra of the plurality of the measurement points that are determined to be on the foreign matter or classifying the same with AI search.Type: GrantFiled: January 6, 2021Date of Patent: February 15, 2022Assignee: JASCO CORPORATIONInventors: Kento Aizawa, Yoshiko Kubo, Erika Taira, Yuji Higuchi
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Publication number: 20210247233Abstract: A method of analyzing foreign matter in a sample includes: measuring an optical spectrum for each of a plurality of measurement points of a measurement region on the sample by a microscopic spectroscope; calculating a feature value of each measured spectrum by a computer; determining whether each of the measurement points is on the foreign matter or not based on each feature value; retaining the spectrum of the measurement point that is determined to be on the foreign matter, and deleting the spectrum of the measurement point that is not determined to be on the foreign matter or storing the same to a storage unit; and executing multivariate analysis of the spectra of the plurality of the measurement points that are determined to be on the foreign matter or classifying the same with AI search.Type: ApplicationFiled: January 6, 2021Publication date: August 12, 2021Applicant: JASCO CORPORATIONInventors: Kento AIZAWA, Yoshiko KUBO, Erika TAIRA, Yuji HIGUCHI
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Publication number: 20210190692Abstract: A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.Type: ApplicationFiled: December 11, 2020Publication date: June 24, 2021Applicant: JASCO CORPORATIONInventors: Kento AIZAWA, Takeo SOEJIMA, Tsutomu INOUE
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Patent number: 11029208Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.Type: GrantFiled: February 6, 2020Date of Patent: June 8, 2021Assignee: JASCO CorporationInventors: Kento Aizawa, Yoshiko Kubo, Norihito Fujiwara, Katsunori Morii
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Publication number: 20200292802Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.Type: ApplicationFiled: February 5, 2020Publication date: September 17, 2020Inventors: Kento AIZAWA, Yoshiko KUBO, Norihito FUJIWARA, Katsunori MORII
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Publication number: 20200271522Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.Type: ApplicationFiled: February 6, 2020Publication date: August 27, 2020Inventors: Kento AIZAWA, Yoshiko KUBO, Norihito FUJIWARA, Katsunori MORII
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Patent number: 10295470Abstract: To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution. The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum.Type: GrantFiled: March 22, 2016Date of Patent: May 21, 2019Assignee: JASCO CorporationInventors: Kento Aizawa, Tsutomu Inoue, Masateru Usuki
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Patent number: 10234665Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light.Type: GrantFiled: April 17, 2018Date of Patent: March 19, 2019Assignee: JASCO CorporationInventors: Kento Aizawa, Hiroshi Sugiyama, Jun Koshobu
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Publication number: 20180307018Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light.Type: ApplicationFiled: April 17, 2018Publication date: October 25, 2018Inventors: Kento AIZAWA, Hiroshi SUGIYAMA, Jun KOSHOBU
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Publication number: 20180067053Abstract: To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution. The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum.Type: ApplicationFiled: March 22, 2016Publication date: March 8, 2018Inventors: Kento AIZAWA, Tsutomu INOUE, Masateru USUKI