Patents by Inventor Kenya Nakai
Kenya Nakai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11719615Abstract: A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.Type: GrantFiled: June 22, 2018Date of Patent: August 8, 2023Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Kenya Nakai, Nozomi Enoki
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Publication number: 20220331309Abstract: The present invention provides an oral pharmaceutical composition for treating insomnia, comprising lemborexant or a pharmaceutically acceptable salt thereof, wherein a normal dose of the lemborexant or pharmaceutically acceptable salt thereof is 5 to 10 mg per day, provided that a dose of the lemborexant or pharmaceutically acceptable salt thereof is 2.5 mg per day when the pharmaceutical composition is administered to a patient together with the agent capable of moderately or strongly inhibiting CYP3A, and/or a dose of the lemborexant or pharmaceutically acceptable salt thereof is 5 mg per day when the pharmaceutical composition is administered to the patient together with the agent capable of weakly inhibiting CYP3A.Type: ApplicationFiled: August 19, 2020Publication date: October 20, 2022Inventors: Ishani Savant Landry, Kenya Nakai, Yukiko Miyajima, Yosuke Nakatani, Takashi Ueno, Edgar Schuck
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Publication number: 20210255086Abstract: A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.Type: ApplicationFiled: June 22, 2018Publication date: August 19, 2021Applicant: Mitsubishi Electric CorporationInventors: Kenya NAKAI, Nozomi ENOKI
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Patent number: 10788362Abstract: A light detection device includes a diffraction element and a light detection element. The diffraction element diffracts a beam of light that is incident on the diffraction element. The light detection element includes light receivers to receive diffracted light. The diffraction element generates beams of the diffracted light by dividing the beam of light. The light detection element determines a displacement of the beam of light relative to the diffraction element on the basis of quantities of light of the beams of the diffracted light. The light detection element determines an angle change of the beam of light relative to the diffraction element by dividing the quantity of light of one of the beams of the diffracted light.Type: GrantFiled: August 3, 2016Date of Patent: September 29, 2020Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Masayuki Omaki, Kenya Nakai
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Patent number: 10670522Abstract: A micro object detection apparatus (11) includes an optical system (50). The first optical system (50) includes a first reflection region (101), a second reflection region (102), and a light reception element (6). The first reflection region (101) has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle (R) to direct the scattered light to the light reception element (6), by utilizing two focal point positions of the ellipsoidal shape. The second reflection region (102) reflects scattered light coming from the particle (R) to direct the scattered light to the first reflection region (101), so that the scattered light is directed to the light reception element (6) by utilizing the ellipsoidal shape of the first reflection region (101). The light flux diameter of the scattered light reflected by the second reflection region (102) is larger than the particle (R), at the position of the particle (R) at which the scattered light is generated.Type: GrantFiled: January 10, 2019Date of Patent: June 2, 2020Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Kenya Nakai
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Publication number: 20190162661Abstract: A micro object detection apparatus (11) includes an optical system (50). The first optical system (50) includes a first reflection region (101), a second reflection region (102), and a light reception element (6). The first reflection region (101) has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle to direct the scattered light to the light reception element (6), by utilizing two focal point positions of the ellipsoidal shape. The second reflection region (102) reflects scattered light coming from the particle (R) to direct the scattered light to the first reflection region (101), so that the scattered light is directed to the light reception element (6) by utilizing the ellipsoidal shape of the first reflection region (101). The light flux diameter of the scattered light reflected by the second reflection region (102) is larger than the particle (R), at the position of the particle (R) ate, which the scattered light is generated.Type: ApplicationFiled: January 10, 2019Publication date: May 30, 2019Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Kenya NAKAI
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Publication number: 20190154500Abstract: A light detection device includes a diffraction element and a light detection element. The diffraction element diffracts a beam of light that is incident on the diffraction element. The light detection element includes light receivers to receive diffracted light. The diffraction element generates beams of the diffracted light by dividing the beam of light. The light detection element determines a displacement of the beam of light relative to the diffraction element on the basis of quantities of light of the beams of the diffracted light. The light detection element determines an angle change of the beam of light relative to the diffraction element by dividing the quantity of light of one of the beams of the diffracted light.Type: ApplicationFiled: August 3, 2016Publication date: May 23, 2019Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Masayuki OMAKI, Kenya NAKAI
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Patent number: 10241043Abstract: A micro object detection apparatus includes an optical system. The first optical system includes a first reflection region, a second reflection region, and a light reception element. The first reflection region has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle to direct the scattered light to the light reception element, by utilizing two focal point positions of the ellipsoidal shape. The second reflection region reflects scattered light coming from the particle to direct the scattered light to the first reflection region, so that the scattered light is directed to the light reception element by utilizing the ellipsoidal shape of the first reflection region. The light flux diameter of the scattered light reflected by the second reflection region is larger than the particle, at the position of the particle at which the scattered light is generated.Type: GrantFiled: December 8, 2016Date of Patent: March 26, 2019Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Kenya Nakai
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Patent number: 10203280Abstract: A micro object detection apparatus includes an optical system. The first optical system includes a first reflection region, a second reflection region, and a light reception element. The first reflection region has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle to direct the scattered light to the light reception element, by utilizing two focal point positions of the ellipsoidal shape. The second reflection region reflects scattered light coming from the particle to direct the scattered light to the first reflection region, so that the scattered light is directed to the light reception element by utilizing the ellipsoidal shape of the first reflection region. The light flux diameter of the scattered light reflected by the second reflection region is larger than the particle, at the position of the particle at which the scattered light is generated.Type: GrantFiled: December 8, 2016Date of Patent: February 12, 2019Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Kenya Nakai
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Publication number: 20180321147Abstract: A micro object detection apparatus includes an optical system. The first optical system includes a first reflection region, a second reflection region, and a light reception element. The first reflection region has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle to direct the scattered light to the light reception element, by utilizing two focal point positions of the ellipsoidal shape. The second reflection region reflects scattered light coming from the particle to direct the scattered light to the first reflection region, so that the scattered light is directed to the light reception element by utilizing the ellipsoidal shape of the first reflection region. The light flux diameter of the scattered light reflected by the second reflection region is larger than the particle, at the position of the particle at which the scattered light is generated.Type: ApplicationFiled: December 8, 2016Publication date: November 8, 2018Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Kenya NAKAI
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Patent number: 9958376Abstract: A floating particle detection device 1 is capable of accurately identifying the type of a floating particle while achieving simplification of a configuration of the device, the device includes: a laser light irradiator (10) that includes a laser light emitting element (11) and a back-monitor-use light receiving element (12); a scattered light receiver (20) that selectively receives light of a predetermined polarization component among scattered light generated when a floating particle (50) is irradiated and that generates a second detection signal; and an identification processor (30) that identifies the type of the floating particle on the basis of a first detection signal and the second detection signal. Incident light entering the back-monitor-use light receiving element (12) includes: a back-monitor-use laser beam (L0); and backscattered light (Lbs) travelling toward the laser light irradiator (10) among the scattered light (Ls).Type: GrantFiled: February 19, 2015Date of Patent: May 1, 2018Assignee: Mitsubishi Electric CorporationInventors: Kenya Nakai, Nobuo Takeshita
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Patent number: 9936176Abstract: An image projection device includes: a light source for emitting a light beam; a mirror unit that includes a mirror for reflecting the beam and projects an image onto a surface by rotating the mirror about a rotational axis to scan the beam; and a controller for determining, according to a function representing a relationship between a shift amount, an emitting time of the beam, a position on the surface irradiated by the beam emitted at the emitting time, and a shift angle of the mirror from its position when it is not driven, the emitting time corresponding to a target position. The shift amount is a shift amount of a position of the beam incident on the mirror or a shift amount of a position of the source relative to an optical axis of light incident on the mirror without the shift amount and perpendicularly intersecting the rotational axis.Type: GrantFiled: January 7, 2015Date of Patent: April 3, 2018Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Kenya Nakai, Nobuo Takeshita
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Publication number: 20170038290Abstract: A floating particle detection device 1 is capable of accurately identifying the type of a floating particle while achieving simplification of a configuration of the device, the device includes: a laser light irradiator (10) that includes a laser light emitting element (11) and a back-monitor-use light receiving element (12); a scattered light receiver (20) that selectively receives light of a predetermined polarization component among scattered light generated when a floating particle (50) is irradiated and that generates a second detection signal; and an identification processor (30) that identifies the type of the floating particle on the basis of a first detection signal and the second detection signal. Incident light entering the back-monitor-use light receiving element (12) includes: a back-monitor-use laser beam (L0); and backscattered light (Lbs) travelling toward the laser light irradiator (10) among the scattered light (Ls).Type: ApplicationFiled: February 19, 2015Publication date: February 9, 2017Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Kenya NAKAI, Nobuo TAKESHITA
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Publication number: 20160330418Abstract: An image projection device includes: a light source for emitting a light beam; a mirror unit that includes a mirror for reflecting the beam and projects an image onto a surface by rotating the mirror about a rotational axis to scan the beam; and a controller for determining, according to a function representing a relationship between a shift amount, an emitting time of the beam, a position on the surface irradiated by the beam emitted at the emitting time, and a shift angle of the mirror from its position when it is not driven, the emitting time corresponding to a target position. The shift amount is a shift amount of a position of the beam incident on the mirror or a shift amount of a position of the source relative to an optical axis of light incident on the mirror without the shift amount and perpendicularly intersecting the rotational axis.Type: ApplicationFiled: January 7, 2015Publication date: November 10, 2016Applicant: Mitsubishi Electric CorporationInventors: Kenya NAKAI, Nobuo TAKESHITA
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Patent number: 9472231Abstract: An optical information recording medium has: a recording layer; a super-resolution functional layer; and a protective layer. Letting n be the refractive index of the protective layer with respect to a laser beam focused by a focusing optical system, ?, be the wavelength of the laser beam, and ds be the depth of recording marks, when the super-resolution functional layer is irradiated by the focused laser beam, it forms a focused light spot including central light that irradiates the recording marks and peripheral light that irradiates a region outside the central light. The optical information recording medium further satisfies either the condition that the central light has a positive phase difference with respect to the peripheral light and ds>?/4n, or the condition that the central light has a negative phase difference with respect to the peripheral light and ds<?/4n.Type: GrantFiled: January 29, 2014Date of Patent: October 18, 2016Assignee: Mitsubishi Electric CorporationInventors: Kenya Nakai, Masayuki Omaki
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Publication number: 20150332726Abstract: An optical information recording medium has: a recording layer; a super-resolution functional layer; and a protective layer. Letting n be the refractive index of the protective layer with respect to a laser beam focused by a focusing optical system, ?, be the wavelength of the laser beam, and ds be the depth of recording marks, when the super-resolution functional layer is irradiated by the focused laser beam, it forms a focused light spot including central light that irradiates the recording marks and peripheral light that irradiates a region outside the central light. The optical information recording medium further satisfies either the condition that the central light has a positive phase difference with respect to the peripheral light and ds>?/4n, or the condition that the central light has a negative phase difference with respect to the peripheral light and ds<?/4n.Type: ApplicationFiled: January 29, 2014Publication date: November 19, 2015Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Kenya NAKAI, Masayuki OMAKI
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Patent number: 9007881Abstract: An optical head device (11) provided with: an optical element (36) for transmissively diffracting a light beam emitted from a semiconductor laser (34), generating a zero-order diffracted light beam and ±1-order diffracted light beams; and a photodetector (40) for receiving the zero-order diffracted light beam and the +1-order diffracted light beam after reflection from an optical disc (2). The photodetector (40) includes a primary light receiving section (400) for receiving the zero-order diffracted light beam, and a first secondary light receiving section (401) disposed outward from the primary light receiving section (400). The first secondary light receiving section (401) is positioned to detect an outer portion of the received light spot of the +1-order diffracted light beam, performs photoelectric conversion of this portion, and outputs a secondary detected signal.Type: GrantFiled: November 26, 2012Date of Patent: April 14, 2015Assignee: Mitsubishi Electric CorporationInventors: Masayuki Omaki, Kenya Nakai, Nobuo Takeshita
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Patent number: 8971163Abstract: An optical disc device uses an optical disc (6) capable of super-resolution reproduction, and includes a semiconductor laser (1), a laser driving circuit (21) that supplies a driving current to the semiconductor laser, a light receiving element (8) that detects return light from the optical disc (6) and obtains reproduction signal of recording data of the optical disc (6), and a light emission amount control means (22) that controls a light emission amount of the semiconductor laser (1) by the laser driving circuit (21) so as to keep a peak intensity of a focused light spot formed on an information recording layer of the optical disc 6 to be greater than or equal to a peak intensity at which a super-resolution effect is obtained.Type: GrantFiled: January 6, 2012Date of Patent: March 3, 2015Assignee: Mitsubishi Electric CorporationInventors: Kenya Nakai, Masayuki Omaki
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Publication number: 20140321251Abstract: An optical head device (11) provided with: an optical element (36) for transmissively diffracting a light beam emitted from a semiconductor laser (34), generating a zero-order diffracted light beam and ±1-order diffracted light beams; and a photodetector (40) for receiving the zero-order diffracted light beam and the +1-order diffracted light beam after reflection from an optical disc (2). The photodetector (40) includes a primary light receiving section (400) for receiving the zero-order diffracted light beam, and a first secondary light receiving section (401) disposed outward from the primary light receiving section (400). The first secondary light receiving section (401) is positioned to detect an outer portion of the received light spot of the +1-order diffracted light beam, performs photoelectric conversion of this portion, and outputs a secondary detected signal.Type: ApplicationFiled: November 26, 2012Publication date: October 30, 2014Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Masayuki Omaki, Kenya Nakai, Nobuo Takeshita
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Patent number: 8787135Abstract: Provided is a signal processing device including: an adaptive filter; a PRML circuit for sequentially generating binarized data from a filtered reproduced waveform by sampling at sampling points in a period based on a clock signal and sequentially generating a partial response waveform which is to be the target waveform from the binarized data; a calculating unit for sequentially calculating first phase errors from a difference between the target waveform and the filtered reproduced waveform; a limiting unit for outputting second phase errors by excluding a specific phase error from the first phase errors; and a clock generating unit for generating the clock signal of a frequency corresponding to the second phase errors; wherein the specific phase error includes a phase error at a time when the partial response waveform reaches a specific level which excludes at least a level not less than a predetermined amplitude level.Type: GrantFiled: February 17, 2012Date of Patent: July 22, 2014Assignee: Mitsubishi Electric CorporationInventors: Masayuki Omaki, Kenya Nakai, Nobuo Takeshita