Abstract: A battery management system includes a microcontroller having a first diagnostic handler application and first and second applications. The first application sets a first non-recoverable diagnostic flag to a first encoded value having each nibble thereof selected from an odd Karnaugh set of binary values. The second application sets a second non-recoverable diagnostic flag to a second encoded value having each nibble thereof selected from an even Karnaugh set of binary values. The first diagnostic handler application sets a first master non-recoverable diagnostic flag to a first encoded fault value if the first non-recoverable diagnostic flag is equal to a second encoded fault value, or the second non-recoverable diagnostic flag is equal to a third encoded fault value.

Abstract: A diagnostic system for a vehicle electrical system having first and second voltage regulators outputting first and second voltages, respectively, is provided. The diagnostic system includes a microcontroller having an analog-to-digital converter, a first application, and a first diagnostic handler application. The first application sets a first analog-to-digital converter status flag equal to a first fault value when a difference between a first corrected voltage value and a second corrected voltage value is greater than a threshold difference value indicating that the analog-to-digital converter is malfunctioning. The first diagnostic handler application commanding a digital input-output device to generate control signals if the first analog-to-digital converter status flag is equal to the first fault value.

Abstract: A diagnostic system for a vehicle electrical system is provided. The diagnostic system includes a microcontroller having microcontroller core components. A first diagnostic handler application sends a first index value to the microcontroller core component diagnostic safety application. The microcontroller core component diagnostic safety application accesses a microcontroller core component diagnostic flag in a first table in the RAM if the first index value is equal to a valid index value in a first table. The microcontroller core component diagnostic safety application sends the microcontroller core component diagnostic flag to the first diagnostic handler application.

Abstract: A diagnostic system for a DC-DC voltage converter includes a microcontroller having a first diagnostic handler application and first and second applications. The first application sets a first non-recoverable diagnostic flag associated with the DC-DC voltage converter to a first encoded value having each nibble thereof selected from an odd Karnaugh set of binary values. The second application sets a second non-recoverable diagnostic flag to a second encoded value having each nibble thereof selected from an even Karnaugh set of binary values. The first diagnostic handler application sets a first master non-recoverable diagnostic flag to a first encoded fault value if the first non-recoverable diagnostic flag is equal to a second encoded fault value, or the second non-recoverable diagnostic flag is equal to a third encoded fault value.

Abstract: A battery cell management system includes a microcontroller having first and second applications and first and second memory buffers. The first and second memory buffers have first and second overvoltage fault bits, respectively, associated with a first battery cell. The first application sets a first encoded overvoltage fault indicator equal to a first fault value if the first overvoltage fault bit of the first memory buffer is equal to a first binary value. The first application receives a second encoded overvoltage fault indicator from the second application. The first application commands a digital input-output device to generate control signals to transition a contactor to an open operational state if either the first encoded overvoltage fault indicator is equal to the first fault value or the second encoded overvoltage fault indicator is equal to a second fault value.

Abstract: A diagnostic system for a battery management system is provided. The diagnostic system includes a microcontroller having application-specific components. A first BMS diagnostic handler application sends a first index value to an application-specific component diagnostic safety application. The application-specific component diagnostic safety application accesses an application-specific component diagnostic flag in a first table in a RAM if the first index value is equal to a valid index value in a first table. The application-specific component diagnostic safety application sends the application-specific component diagnostic flag to the first BMS diagnostic handler application.

Abstract: A battery management system having a microcontroller with first and second applications and first and second tables is provided. The first table has a first record with a first encoded channel index and a first battery cell voltage value associated with a first battery cell. The second table has a first record with a first encoded channel index and a first battery cell overvoltage flag associated with the first battery cell. The first application sends the first encoded channel index from the first table to the second application. The second application transitions a contactor to an open operational position, when the first encoded channel index from the first table is not equal to a first predetermined encoded channel index indicating a data misalignment of the first battery cell voltage value and the first battery cell overvoltage flag.

Abstract: A diagnostic system for a battery management system is provided. The diagnostic system includes a microcontroller having application-specific components. A first BMS diagnostic handler application sends a first index value to an application-specific component diagnostic safety application. The application-specific component diagnostic safety application accesses an application-specific component diagnostic flag in a first table in a RAM if the first index value is equal to a valid index value in a first table. The application-specific component diagnostic safety application sends the application-specific component diagnostic flag to the first BMS diagnostic handler application.

Abstract: A diagnostic system includes a microcontroller having a first A/D converter, first and second applications, and a first analog multiplexer electrically between a first voltage regulator and the first A/D converter. The first application sets a first overvoltage diagnostic flag to a first fault value if a first voltage of the first voltage regulator that is measured by the first A/D converter is greater than a first voltage, and in response further transitions a contactor to an open operational state. The second application sets a second overvoltage diagnostic flag to a second fault value if a second voltage of the first voltage regulator that is measured by the first A/D converter is greater than a second voltage, and in response further transitions the contactor to the open operational state.

Abstract: A diagnostic system for a vehicle electrical system is provided. The diagnostic system includes a microcontroller having microcontroller core components. A first diagnostic handler application sends a first index value to the microcontroller core component diagnostic safety application. The microcontroller core component diagnostic safety application accesses a microcontroller core component diagnostic flag in a first table in the RAM if the first index value is equal to a valid index value in a first table.

Abstract: A power supply architecture provides for the efficient distribution and failsafe monitoring of power in a microcontroller system. The power supply architecture incorporates various components with high integrity and diverse monitoring schemes that allow the associated control processors to operate with high safety standards. The various embodiments provide an integrated method or apparatus for an electronic module safety architecture which includes diversity, time and space independence for power supplies for the various microprocessors and control communication buses.

Abstract: A self-diagnosing battery cell monitoring system having a battery cell voltage monitoring IC with a digital voltage substrate, an analog differential voltage substrate, and an analog voltage substrate is provided. The first diagnostic handler application commands a digital input-output device to generate control signals to transition a contactor to an open operational state if the first diagnostic flag associated with the digital voltage substrate is equal to the first encoded fault value, or the second diagnostic flag associated with the analog differential voltage substrate is equal to the second encoded fault value, or the third diagnostic flag associated with the analog voltage substrate is equal to the third encoded fault value.

Abstract: A battery management system includes a microcontroller having first and second applications. The first application transitions a contactor to an open operational position if a first CRC diagnostic flag is equal to a first encoded fault value. The second application transitions the contactor to the open operational position if a second CRC diagnostic flag is equal to a second encoded fault value. The first and second encoded fault values have a Hamming distance of at least four from one another.

Abstract: A diagnostic system is provided. A first monitoring application sets a first voltage regulator status flag equal to a first fault value when a first voltage value is greater than a first maximum voltage value. A first diagnostic handler application transitions each of a high voltage switch and a low voltage switch to an open operational state when the first voltage regulator status flag is equal to the first fault value. A second monitoring application sets a second voltage regulator status flag equal to a second fault value when the second voltage value is less than a first minimum voltage value. A second diagnostic handler application transitions the high voltage switch and the low voltage switch to the open operational state when the second voltage regulator status flag is equal to the second fault value.

Abstract: A self-diagnosing microcontroller includes a microprocessor having first and second applications, and a hardware abstraction layer. The microprocessor is operably coupled to an analog-to-digital converter. The hardware abstraction layer sequentially sets a first pre-check indicator to a first fault value for each encoded channel number of a second plurality of encoded channel numbers that does not have an identical and corresponding encoded channel number in a first plurality of encoded channel numbers indicating an incorrect channel was read from the analog-to-digital converter, and sends the first pre-check indicator to the first application.

Abstract: A diagnostic having an analog-to-digital converter that is electrically coupled to an output port of a first analog multiplexer and an output port of a second analog multiplexer is provided. The analog-to-digital converter receives the high side voltage level signal and the low side current level signal at first and second times, respectively, and outputs a high side voltage value and a low side current value, respectively, based on the high side voltage level signal and the low side current level signal, respectively, that are received by a microcontroller. The microcontroller commands a high side driver circuit and a low side driver circuit to transition a contact of the contactor to an open operational position when the first analog multiplexer is malfunctioning based on the high side voltage value.

Abstract: A diagnostic system having first and second applications is provided. The first application multiplies a first voltage value associated with a voltage regulator by a first correction value to obtain a first corrected voltage value. The first application receives a second corrected voltage value from the second application. The first application sets a first voltage regulator status flag equal to a first fault value when a difference between the first and second corrected voltage values is greater than a threshold difference value. The first diagnostic handler application generates control signals if the first voltage regulator status flag is equal to the first fault value.

Abstract: A power supply diagnostic strategy for discrete power supply diagnostic states is independent of the underlying memory structure. The values used in the associated algorithm are selected to ensure that random linked failures will be detected. This applies to planar memory structures with 1, 2, 4, 6, 8, 12, and 16 common lattices, or physical memory structures with individual bit dispersed memories with 1, 2, 4, 6, 8, 12, and 16 consecutive bit splices. Further, the strategy provides that the various monitored voltage tables remains distinct even with compiler optimization activated.

Abstract: A self-diagnosing watchdog monitoring system having a watchdog IC and a microcontroller is provided. The microcontroller has a microprocessor, and a digital input/output device with an enable pin and a disable pin. An enable application in the microcontroller monitors the disable pin of the digital input-output device, and if the disable pin does not have a low logic state within a predetermined amount of time after a first time indicating that the disable application is malfunctioning, then the enable application generates a control message.

Abstract: A diagnostic system for a DC-DC voltage converter having a high voltage switch, a low voltage switch, and a DC-DC voltage converter control circuit is provided. The system includes first and second tri-state buffer ICs and a microcontroller. The first tri-state buffer IC receives a first shutdown indicator voltage from the DC-DC voltage converter control circuit indicating that a first plurality of FET switches in a high side FET IC and a second plurality of FET switches in a low side FET IC have been transitioned to an open operational state. The first tri-state buffer IC outputs a second shutdown indicator voltage to the microcontroller that indicates that the first and second plurality of FET switches have been transitioned to the open operational state.