Patents by Inventor Kerin Gregory

Kerin Gregory has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mass spectrometry by detecting positively and negatively charged particles
    Patent number: 11501961
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Grant
    Filed: February 23, 2018
    Date of Patent: November 15, 2022
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • MASS SPECTROMETRY BY DETECTING POSITIVELY AND NEGATIVELY CHARGED PARTICLES
    Publication number: 20180247803
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Application
    Filed: February 23, 2018
    Publication date: August 30, 2018
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • Mass spectrometry by detecting positively and negatively charged particles
    Patent number: 9905407
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Grant
    Filed: October 1, 2015
    Date of Patent: February 27, 2018
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • MASS SPECTROMETRY BY DETECTING POSITIVELY AND NEGATIVELY CHARGED PARTICLES
    Publication number: 20160099137
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Application
    Filed: October 1, 2015
    Publication date: April 7, 2016
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo