Patents by Inventor Kerry P. Pfarr

Kerry P. Pfarr has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures
    Patent number: 9599664
    Abstract: Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.
    Type: Grant
    Filed: May 15, 2015
    Date of Patent: March 21, 2017
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Luke D. Lacroix, Mark C. H. Lamorey, Steven F. Oakland, Janak G. Patel, Kerry P. Pfarr, Peter Slota, Jr., David B. Stone
  • CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT CHIP, METHODS OF USE AND MANUFACTURE AND DESIGN STRUCTURES
    Publication number: 20150247896
    Abstract: Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.
    Type: Application
    Filed: May 15, 2015
    Publication date: September 3, 2015
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Luke D. Lacroix, Mark C. H. Lamorey, Steven F. Oakland, Janak G. Patel, Kerry P. Pfarr, Peter Slota, JR., David B. Stone
  • Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures
    Patent number: 9057760
    Abstract: Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.
    Type: Grant
    Filed: January 20, 2011
    Date of Patent: June 16, 2015
    Assignee: International Business Machines Corporation
    Inventors: Luke D. Lacroix, Mark C. H. Lamorey, Steven F. Oakland, Janak G. Patel, Kerry P. Pfarr, Peter Slota, Jr., David B. Stone
  • CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT CHIP, METHODS OF USE AND MANUFACTURE AND DESIGN STRUCTURES
    Publication number: 20120187953
    Abstract: Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.
    Type: Application
    Filed: January 20, 2011
    Publication date: July 26, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Luke D. LACROIX, Mark C.H. Lamorey, Steven F. Oakland, Janak G. Patel, Kerry P. Pfarr, Peter Slota, JR., David B. Stone