Abstract: Systems and methods of intrusion detection into a rack enclosure are disclosed. An example method may include, extracting a projected light terminator image from a captured image, performing image correction operations on the projected light terminator image, processing the projected light terminator image utilizing image processing operations to determine a corrected projected light terminator image, determining a collection of image segments based on the corrected projected light terminator image, establishing one or more baseline image metrics of the collection of the image segments, evaluating the one or more baseline image metrics for changes with operational image segment characteristics, and communicating any baseline image metric changes to a management device.

Abstract: Systems and methods of proximity detection for a rack enclosure are disclosed. An example system may comprise, extracting, at a processor, a boundary mask image from a captured image, performing, at a processor, image correction operations on the boundary mask image, processing, at a processor, the boundary mask image utilizing image processing operations to determine a corrected boundary mask image, determining, at a processor, a mesh of image segments based on the corrected boundary mask image, establishing, at a processor, one or more baseline image metrics of the mesh of the image segments, evaluating, at a processor, the one or more baseline image metrics for changes with operational image segment characteristics, and communicating, at a processor, any baseline image metric changes to a management device.