Patents by Inventor Ke-Sheng Wang

Ke-Sheng Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250038074
    Abstract: A method includes forming a first multilayer interconnect structure over a first side of a device layer, forming a first portion of a second multilayer interconnect structure under a second side of the device layer, forming a trench that extends through the second dielectric layer, the device layer, and the first dielectric layer, forming a conductive structure in the trench, and forming a second portion of the second multilayer interconnect structure under the first portion of the second multilayer interconnect structure. The second portion of the second multilayer interconnect structure includes patterned metal layers disposed in a third dielectric layer, and wherein one or more of the patterned metal layers are in electrical connection with the conductive structure.
    Type: Application
    Filed: December 1, 2023
    Publication date: January 30, 2025
    Inventors: Tsung-Chieh Hsiao, Yi Ling Liu, Yun-Sheng Li, Ke-Gang Wen, Yu-Bey Wu, Liang-Wei Wang, Dian-Hau Chen
  • Patent number: 7304481
    Abstract: In one preferred embodiment, an apparatus for testing a cable includes an interface for connecting to a connector of the cable, many resistors, a socket, and a meter for testing resistance of the resistors. The interface has many pins, the resistors respectively connected to the pins in series, and the socket is electrically connected to the pins respectively via the resistors. The meter includes two probes, one of the probes is connected to another connector of the cable, and the other one of the probes is plugged into the socket. Because conductors of the cable are respectively connected to the resistors in series, the user can tell whether the cable has a fault according to the resistance indicated by the meter.
    Type: Grant
    Filed: April 22, 2006
    Date of Patent: December 4, 2007
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Sheng-Liang Wu, Ke-Sheng Wang
  • Publication number: 20070046302
    Abstract: In one preferred embodiment, an apparatus for testing a cable includes an interface for connecting to a connector of the cable, many resistors, a socket, and a meter for testing resistance of the resistors. The interface has many pins, the resistors respectively connected to the pins in series, and the socket is electrically connected to the pins respectively via the resistors. The meter includes two probes, one of the probes is connected to another connector of the cable, and the other one of the probes is plugged into the socket. Because conductors of the cable are respectively connected to the resistors in series, the user can tell whether the cable has a fault according to the resistance indicated by the meter.
    Type: Application
    Filed: April 22, 2006
    Publication date: March 1, 2007
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Sheng-Liang Wu, Ke-Sheng Wang