Abstract: An area efficient input terminated readable and resettable configuration memory latch is disclosed. A pull-up network and a pair of pull-down networks operate to set the value of an internal node based, in part, on the state of the input terminated bit line and a word line write input. The internal node is inverted to form the output of the configuration memory latch. A reset line operates to reset the latch and a reset cycle is initiated prior to each write cycle. In some embodiments, the configuration memory latch includes a scan mode input, which, when asserted, facilitates automated testing of a programmable logic device that includes the configuration memory latch. Asserting the scan mode input enables Design for Test functionality. A sensing block is configured to sense the state of the bit when a word line read signal and a read enable signal are both asserted.

Abstract: An area efficient readable and resettable configuration memory latch is disclosed that maintains latch data integrity through read and write operations and includes a non-terminated inout bit line (BL). During write operations, enabled by a Word Line Write (WLW) signal, the non-terminated inout BL drives data to be written, while, during read operations, enabled by a Word Line Read (WLR) signal, the state of the BL is indicative of a data stored in the latch. A pull-down network is activated when the WLR signal is asserted and the stored data is logic one and, when activated, operates to pull down the BL to logic zero; the pull-down network is inactive otherwise. A weak pull-up operates to pull up the BL when the pull-down network is inactive. A sensing block is configured to sense the state of the BL when the WLR signal and a read enable signal are both asserted.

Abstract: A programmable logic device (PLD) supports scan testing of configurable logical blocks using scannable word line (WL) shift register (WLSR) chains to enable writes to configurable memory bits while scan test data is input via a scan chain comprising scannable bit line (BL) shift registers (BLSRs). Input test data may be shifted onto BLs to write data into a configurable memory bit when a corresponding WL associated with the configurable memory bit is asserted. Logic blocks may comprise: latch-based configurable memory bits, scannable WLSRs forming a distinct WLSR chain in shift mode and driving corresponding WLs. Each WL, when asserted, enables writes to a corresponding configurable memory bit. A scannable BLSR receives serial scan test vector input in shift mode and drives a corresponding BL coupled to the configurable memory bit to write data to the configurable memory bit when the associated WL is asserted.

Abstract: A bit line (BL) may be coupled at a first end to a BL driver (BLD) and at a second end to a BL receiver (BLR). The BL include a plurality of sections and each BL section may be coupled to at least one corresponding sectional configuration memory latch controlled by: at least one sectional word line write (WLW-k) signal, which when asserted enables data to be written into the at least one corresponding sectional configuration memory latch when a corresponding tri-stateable sectional driver (SD-k) is activated, and at least one sectional word line read (WLR-k) signal, which when asserted enables data to be from the at least one corresponding sectional configuration memory latch when the corresponding sectional pull-up (PU-k) is activated.

Abstract: An area efficient input terminated readable and resettable configuration memory latch is disclosed. A pull-up network and a pair of pull-down networks operate to set the value of an internal node based, in part, on the state of the input terminated bit line and a word line write input. The internal node is inverted to form the output of the configuration memory latch. A reset line operates to reset the latch and a reset cycle is initiated prior to each write cycle. In some embodiments, the configuration memory latch includes a scan mode input, which, when asserted, facilitates automated testing of a programmable logic device that includes the configuration memory latch. Asserting the scan mode input enables Design for Test functionality. A sensing block is configured to sense the state of the bit when a word line read signal and a read enable signal are both asserted.

Abstract: A programmable logic device (PLD) supports scan testing of configurable logical blocks using scannable word line (WL) shift register (WLSR) chains to enable writes to configurable memory bits while scan test data is input via a scan chain comprising scannable bit line (BL) shift registers (BLSRs). Input test data may be shifted onto BLs to write data into a configurable memory bit when a corresponding WL associated with the configurable memory bit is asserted. Logic blocks may comprise: latch-based configurable memory bits, scannable WLSRs forming a distinct WLSR chain in shift mode and driving corresponding WLs. Each WL, when asserted, enables writes to a corresponding configurable memory bit. A scannable BLSR receives serial scan test vector input in shift mode and drives a corresponding BL coupled to the configurable memory bit to write data to the configurable memory bit when the associated WL is asserted.

Abstract: An area efficient readable and resettable configuration memory latch is disclosed that maintains latch data integrity through read and write operations and includes a non-terminated inout bit line (BL). During write operations, enabled by a Word Line Write (WLW) signal, the non-terminated inout BL drives data to be written, while, during read operations, enabled by a Word Line Read (WLR) signal, the state of the BL is indicative of a data stored in the latch. A pull-down network is activated when the WLR signal is asserted and the stored data is logic one and, when activated, operates to pull down the BL to logic zero; the pull-down network is inactive otherwise. A weak pull-up operates to pull up the BL when the pull-down network is inactive. A sensing block is configured to sense the state of the BL when the WLR signal and a read enable signal are both asserted.

Abstract: A bit line (BL) may be coupled at a first end to a BL driver (BLD) and at a second end to a BL receiver (BLR). The BL include a plurality of sections and each BL section may be coupled to at least one corresponding sectional configuration memory latch controlled by: at least one sectional word line write (WLW-k) signal, which when asserted enables data to be written into the at least one corresponding sectional configuration memory latch when a corresponding tri-stateable sectional driver (SD-k) is activated, and at least one sectional word line read (WLR-k) signal, which when asserted enables data to be from the at least one corresponding sectional configuration memory latch when the corresponding sectional pull-up (PU-k) is activated.

Abstract: A programmable logic device uses power island based design partitioning. Each power islands includes a plurality of programmable logic cells and a programmable routing network configurable to interconnect the plurality of programmable logic cells and configurable to interconnect with at least one other power island. When a power island is in an OFF state, the programmable logic cells within the power island are powered OFF. Feed-through routing connectors in the power island, however, may be statically or dynamically powered ON independently of the powered OFF state of the power island.

Abstract: A programmable logic device uses power island based design partitioning. Each power islands includes a plurality of programmable logic cells and a programmable routing network configurable to interconnect the plurality of programmable logic cells and configurable to interconnect with at least one other power island. When a power island is in an OFF state, the programmable logic cells within the power island are powered OFF. Feed-through routing connectors in the power island, however, may be statically or dynamically powered ON independently of the powered OFF state of the power island.

Abstract: An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily modified to accommodate the different interface I/O demands of various dedicated devices that may be embedded into the integrated circuit. In one embodiment, the interface circuit may be implemented using a plurality of mask programmable uni-directional interface buffer circuits. The direction of any desired number of the interface buffer circuits can be reversed based on the needs of a desired dedicated device by re-routing the conductors in the interface buffer circuits in a single metal layer of the integrated circuit. In another embodiment, the interface circuit may be implemented using a hardware configurable bi-directional interface buffer circuit.

Abstract: Testing of combinatorial logic in a programmable device is provided by routing input and/or output test values as signals from and back to dedicated logic through programming circuitry in programmable logic. Some embodiments of the present invention provide for a method for testing functional logic block of an application-specific standard product (ASSP) in a programmable logic device, the method comprising: storing an input value into a register; passing the input value from the register to combinatorial logic; producing an output value from the combinatorial logic; passing the output value from the combinatorial logic to the register; saving the output value in the register; and reading the output value out of the register.

Abstract: An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily modified to accommodate the different interface I/O demands of various dedicated devices that may be embedded into the integrated circuit. In one embodiment, the interface circuit may be implemented using a plurality of mask programmable uni-directional interface buffer circuits. The direction of any desired number of the interface buffer circuits can be reversed based on the needs of a desired dedicated device by re-routing the conductors in the interface buffer circuits in a single metal layer of the integrated circuit. In another embodiment, the interface circuit may be implemented using a hardware configurable bi-directional interface buffer circuit.

Abstract: An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily modified to accommodate the different interface I/O demands of various dedicated devices that may be embedded into the integrated circuit. In one embodiment, the interface circuit may be implemented using a plurality of mask programmable uni-directional interface buffer circuits. The direction of any desired number of the interface buffer circuits can be reversed based on the needs of a desired dedicated device by re-routing the conductors in the interface buffer circuits in a single metal layer of the integrated circuit. In another embodiment, the interface circuit may be implemented using a hardware configurable bi-directional interface buffer circuit.

Abstract: An apparatus and method of reducing power consumption across a switch, such as an unprogrammed antifuse, is provided. The invention applies to antifuses, other switches such as transistor based switches, (e.g., FLASH, EEPROM and/or SRAM) and other devices exhibiting a leakage current, especially during a sleep or stand-by mode. During a sleep mode, such switches or other devices may be uncoupled from signals driving the switches, then terminals of each switch may be coupled to a common potential or allowed to float to a common potential thereby eliminating or reducing leakage currents through the switches.

Abstract: Testing of combinatorial logic in a programmable device is provided by routing input and/or output test values as signals from and back to dedicated logic through programming circuitry in programmable logic.

Abstract: An apparatus and method of reducing power consumption across a switch, such as an unprogrammed antifuse, is provided. The invention applies to antifuses, other switches such as transistor based switches, (e.g., FLASH, EEPROM and/or SRAM) and other devices exhibiting a leakage current, especially during a sleep or stand-by mode. During a sleep mode, such switches or other devices may be uncoupled from signals driving the switches, then terminals of each switch may be coupled to a common potential or allowed to float to a common potential thereby eliminating or reducing leakage currents through the switches.

Abstract: An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily modified to accommodate the different interface I/O demands of various dedicated devices that may be embedded into the integrated circuit. In one embodiment, the interface circuit may be implemented using a plurality of mask programmable uni-directional interface buffer circuits. The direction of any desired number of the interface buffer circuits can be reversed based on the needs of a desired dedicated device by re-routing the conductors in the interface buffer circuits in a single metal layer of the integrated circuit. In another embodiment, the interface circuit may be implemented using a hardware configurable bi-directional interface buffer circuit.

Abstract: A programmable circuit, such as a field programmable gate array, and a dedicated device, such as an ASIC type device, are coupled together with an antifuse based interface on a single integrated circuit. A configurable non-volatile memory that communicates with the dedicated device is also located on the integrated circuit. The platform for the programmable circuit is one half of an existing programmable circuit, which eliminates the need to engineer the programmable circuit. The programmable circuit includes a clock network that receives clock signals from clock terminals as well as from a clock network in the dedicated device. The interface between the dedicated device and programmable circuit includes a number of conductors with buffers with testing circuitry. The testing circuitry includes a PMOS test transistor and a NMOS test transistor which permits testing of the buffers without programming the antifuses coupled to the conductors.

Abstract: In accordance with the invention, a serializer/deserializer core of a field programmable gate array includes a channel clock and a data channel. The data channel can serialize and deserialize data in two modes. In the first mode, an embedded clock signal is recovered from the data. In the second mode, a clock signal is provided by the channel clock. A selection signal determines in which mode each of the data channels in the serializer/deserializer core operates. An stair-step clock generator generates a series of rising edge signals used to serialize and deserialize data. The number of bits serialized and deserialized is determined by the control signals to a set of multiplexers in the stair-step clock generator which determine how many registers in the stair-step clock generator are activated.