Patents by Inventor Kevin B. Badgett

Kevin B. Badgett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Centralized MBIST failure information
    Patent number: 8392777
    Abstract: Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.
    Type: Grant
    Filed: August 27, 2009
    Date of Patent: March 5, 2013
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Wei-Yu Chen, Kevin B. Badgett, Siegfried Kay Hesse, Timothy J. Wood
  • CENTRALIZED MBIST FAILURE INFORMATION
    Publication number: 20110055644
    Abstract: Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.
    Type: Application
    Filed: August 27, 2009
    Publication date: March 3, 2011
    Inventors: Wei-Yu Chen, Kevin B. Badgett, Siegfried Kay Hesse, Timothy J. Wood