Patents by Inventor Kevin Cadena

Kevin Cadena has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and functional architecture for inline repair of defective imaging arrays
    Patent number: 10926357
    Abstract: A method for improving the performance of an image sensor array includes performing an electrical test on the image sensor array, generating a test image from the electrical test to detect an open circuit in a data line of the image sensor array, performing a laser-weld operation the data line to weld a portion of the data line to ground, re-testing the image sensor array to confirm a successful laser-weld operation, performing a laser-cut on a readout portion of the data line, and re-testing the image sensor array to confirm a successful laser-cut operation.
    Type: Grant
    Filed: April 12, 2018
    Date of Patent: February 23, 2021
    Assignee: DPIX, LLC
    Inventors: Jerome David Crocco, Kevin Cadena, Michael Keith Forsyth
  • Method of providing a high density test contact solution
    Patent number: 10295566
    Abstract: A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer, without a specific connector pattern associated either with the transport layer or a device under test.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: May 21, 2019
    Assignee: DPIX, LLC
    Inventors: Kevin Cadena, Kevin Granaas, John Luther, Shawn Michael O'Rourke
  • Method and Functional Architecture for Inline Repair of Defective Imaging Arrays
    Publication number: 20180339367
    Abstract: A method for improving the performance of an image sensor array includes performing an electrical test on the image sensor array, generating a test image from the electrical test to detect an open circuit in a data line of the image sensor array, performing a laser-weld operation the data line to weld a portion of the data line to ground, re-testing the image sensor array to confirm a successful laser-weld operation, performing a laser-cut on a readout portion of the data line, and re-testing the image sensor array to confirm a successful laser-cut operation.
    Type: Application
    Filed: April 12, 2018
    Publication date: November 29, 2018
    Inventors: Jerome David Crocco, Kevin Cadena, Michael Keith Forsyth
  • METHOD OF PROVIDING A HIGH DENSITY TEST CONTACT SOLUTION
    Publication number: 20170242056
    Abstract: A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer without a specific connector pattern associated either with the transport layer or a device under test.
    Type: Application
    Filed: February 9, 2017
    Publication date: August 24, 2017
    Inventors: Kevin Cadena, Kevin Granaas, John Luther, Shawn Michael O'Rourke