Abstract: An apparatus and method for triggering an oscilloscope is disclosed. The oscilloscope is configured to process a first signal in a first domain and a second signal in a second domain. The method includes choosing a different domain for processing each of the first and second signals, respectively. A desired trigger type is selected for one of the chosen domains. The first and second signals are acquired in response to an occurrence of a trigger of the selected trigger type. The first and second signals are processed according to the selected different chosen domains. The method may also include displaying a result of said processing on a display screen.

Abstract: An apparatus and method for triggering an oscilloscope is disclosed. The oscilloscope is configured to process a first signal in a first domain and a second signal in a second domain. The method includes choosing a different domain for processing each of the first and second signals, respectively. A desired trigger type is selected for one of the chosen domains. The first and second signals are acquired in response to an occurrence of a trigger of the selected trigger type. The first and second signals are processed according to the selected different chosen domains. The method may also include displaying a result of said processing on a display screen.

Abstract: A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument.

Abstract: A test and measurement instrument and a method of calibrating the test and measurement instrument including a reference signal generator; multiple input channels; and multiple input circuits. Each input channel is coupled to a corresponding input circuit; and one of the input circuits is coupled to the reference signal generator.

Abstract: A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument.

Abstract: Bussing high frequency crosspoint switches is achieved by extending an output transmission line bus through an integrated circuit (IC) upon which the crosspoint switch is laid. The internal portion of the output transmission line bus is coupled to an output pad on the IC via a bond wire. This eliminates stubs from the output of the IC to the output transmission line as well as compensating for parasitic capacitance associated with the output pad.

Abstract: A high-frequency calibration method and circuit including a dual path step attenuator. A calibration system is provided having a switch between the user signal input and the instrument input and an amplifier between the calibration signal input and the instrument input. The amplifier provides signal conditioning. The output of the amplifier is connected to the instrument input through a switch and a resistor, the resistor isolating the switch from the instrument input so as effectively to prevent degradation of the user input signal. A sense amplifier provides a calibration signal output indicative of the input impedance of the instrument input in response to a known stimulus. The input of the sense amplifier is isolated from the instrument input by a resistor. A current source provides a known stimulus to the instrument input to measure input impedance. A step attenuator is provided having an attenuated path and an unattenuated path.

Abstract: A high-frequency calibration method and circuit including a dual path step attenuator. A calibration system is provided having a switch between the user signal input and the instrument input and an amplifier between the calibration signal input and the instrument input. The amplifier provides signal conditioning. The output of the amplifier is connected to the instrument input through a switch and a resistor, the resistor isolating the switch from the instrument input so as effectively to prevent degradation of the user input signal. A sense amplifier provides a calibration signal output indicative of the input impedance of the instrument input in response to a known stimulus. The input of the sense amplifier is isolated from the instrument input by a resistor. A current source provides a known stimulus to the instrument input to measure input impedance. A step attenuator is provided having an attenuated path and an unattenuated path.