Abstract: A method includes obtaining data indicating an amount of energy stored by a battery of a sensor device; receiving data related to at least one condition in an area in which the sensor device is located; determining a reporting interval based on the data indicating the amount of energy stored by the battery of the sensor device and the data related to at least one condition in the area in which the sensor device is located; transmitting data indicating the reporting interval to the sensor device; and receiving a plurality of measurement reports transmitted from the sensor device according to the reporting interval. The energy consumed by the sensor device can be dynamically modified by dynamically modifying the reporting interval.

Abstract: A method includes obtaining a value corresponding to a current amount of power output from a solar panel; determining a value corresponding to an expected amount of power output from the solar panel; comparing the value corresponding to the current amount of power output from the solar panel and the value corresponding to the expected amount of power output from the solar panel of the device; and cleaning the solar panel responsive to determining, based on the comparing, that the value corresponding to the current amount of power output from the solar panel is less than the value corresponding to the expected amount of power output from the solar panel by at least a first threshold value

Abstract: A method includes obtaining data indicating an amount of energy stored by a battery of a sensor device; receiving data related to at least one condition in an area in which the sensor device is located; determining a reporting interval based on the data indicating the amount of energy stored by the battery of the sensor device and the data related to at least one condition in the area in which the sensor device is located; transmitting data indicating the reporting interval to the sensor device; and receiving a plurality of measurement reports transmitted from the sensor device according to the reporting interval. The energy consumed by the sensor device can be dynamically modified by dynamically modifying the reporting interval.

Abstract: Systems and methods for monitoring and controlling the operation of extreme ultraviolet (EUV) sources used in semiconductor fabrication are disclosed. A method comprises providing a semiconductor fabrication apparatus having a light source that emits in-band and out-of-band radiation, taking a first out-of-band radiation measurement, taking a second out-of-band radiation measurement, and controlling the in-band radiation of the light source, at least in part, based upon a comparison of the first and second out-of-band measurements. An apparatus comprises a detector operable to detect out-of-band EUV radiation emitted by an EUV plasma source, a spectrometer coupled to the electromagnetic detector and operable to measure at least one out-of-band radiation parameter based upon the detected out-of-band EUV radiation, and a controller coupled to the spectrometer and operable to monitor and control the operation of the EUV plasma source based upon the out-of-band measurements.

Abstract: Systems and methods for monitoring and controlling the operation of extreme ultraviolet (EUV) sources used in semiconductor fabrication are disclosed. A method comprises providing a semiconductor fabrication apparatus having a light source that emits in-band and out-of-band radiation, taking a first out-of-band radiation measurement, taking a second out-of-band radiation measurement, and controlling the in-band radiation of the light source, at least in part, based upon a comparison of the first and second out-of-band measurements. An apparatus comprises a detector operable to detect out-of-band EUV radiation emitted by an EUV plasma source, a spectrometer coupled to the electromagnetic detector and operable to measure at least one out-of-band radiation parameter based upon the detected out-of-band EUV radiation, and a controller coupled to the spectrometer and operable to monitor and control the operation of the EUV plasma source based upon the out-of-band measurements.

Abstract: A vehicle testing apparatus for subjecting a vehicle to a compound force includes a support disposed in a plane for supporting the vehicle, and a mechanism coupled to the support for moving the support along at least one of three perpendicular axes. The mechanism subjects the vehicle to the compound force resulting from simultaneous movements along any combination of the axes. The mechanism includes a first platform constrained for rectilinear movement along a first axis, and a second platform constrained for rectilinear movement along a second axis, with the support preferably also being movable along a third axis. The support preferably also includes actively or passively controlled contact surfaces in all three axes with an optional trip mechanism. In addition, a first actuating device is preferably coupled to the first platform and a second actuating device is preferably coupled to the second platform.

Abstract: A method of replicating a real-world vehicle rollover of a vehicle having wheels utilizing a vehicle testing apparatus having a support. The method includes positioning the vehicle on the support. Static properties of the vehicle are then determined. An initial set of forces and moments to be applied to the support are determined based upon at least the static properties. The support is actuated based upon the initial set of forces and moments to replicate the vehicle rollover. An actual response of the vehicle to the initial actuating of the vehicle testing apparatus is measured to determine dynamic properties of the vehicle. So long as all of the wheels remained on the support during the actuating of the vehicle testing apparatus, sets of forces and moments are continuously determined. The vehicle testing apparatus can be repeatedly actuated based upon the sets of forces and moments to further replicate the vehicle rollover.

Abstract: The subject invention provides a vehicle testing apparatus (10, 110) for subjecting a vehicle (12) to a compound force. The vehicle testing apparatus (10, 110) includes a support (14) disposed in a plane for supporting the vehicle (12). The vehicle testing apparatus (10, 110) further includes a mechanism (34) coupled to the support (14) for moving the support (14) along and around at least one of three axes (X, Y, Z). The mechanism (34) subjects the vehicle (12) to the compound force that is the result of simultaneous movements along and around any combination of the axes (X, Y, Z) while controlling the reaction forces. The mechanism (34) includes a first platform (36) constrained for rectilinear movement along a first axis (X), and a second platform (38) constrained for rectilinear movement along a second axis (Y), with the support 14 being movable along a third axis (Z).

Abstract: A method of replicating a real-world vehicle rollover of a vehicle having wheels utilizing a vehicle testing apparatus having a support. The method includes positioning the vehicle on the support. Static properties of the vehicle are then determined. An initial set of forces and moments to be applied to the support are determined based upon at least the static properties. The support is actuated based upon the initial set of forces and moments to replicate the vehicle rollover. An actual response of the vehicle to the initial actuating of the vehicle testing apparatus is measured to determine dynamic properties of the vehicle. So long as all of the wheels remained on the support during the actuating of the vehicle testing apparatus, sets of forces and moments are continuously determined. The vehicle testing apparatus can be repeatedly actuated based upon the sets of forces and moments to further replicate the vehicle rollover.

Abstract: A rotary peristaltic pump that can supply fluids accurately at desired flow rates and with the desired control over pulsations normally experienced when using peristaltic pumps. The control is provided, in one aspect, by varying the radius of the shell against which the compression devices act to deform the tubing. In another aspect, the torque needed to turn the rotor is equalized throughout the rotation of the rotor to further enhance the flow rate accuracy of the pump. Torque equalization is preferably enhanced by use of a torque control cam positioned about the rotor.

Abstract: A pattern of dummy structures (20) is added to the layout pattern of an integrated circuit (10) to equilibrate the polishing rate across the surface of a semiconductor substrate (11). The location of each dummy structure (20) is predetermined so that it does not intersect a well boundary (17) or an active region (21,27), and does not fall under a conductive material such as a layer of polysilicon (22,28) or an interconnect structure (23,29).