Patents by Inventor Kevin Kjoller

Kevin Kjoller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11714103
    Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
    Type: Grant
    Filed: February 9, 2021
    Date of Patent: August 1, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Craig Prater, Kevin Kjoller
  • Publication number: 20230236112
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Application
    Filed: January 31, 2023
    Publication date: July 27, 2023
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 11680892
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: June 20, 2023
    Assignee: Photothermal Spectroscopy Corp
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Publication number: 20220065772
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Application
    Filed: May 10, 2021
    Publication date: March 3, 2022
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 11226285
    Abstract: System and Methods may be provided for performing chemical spectroscopy on samples from the scale of nanometers with surface sensitivity even on very thick sample. In the method, a signal indicative of infrared absorption of the surface layer is constructed by illuminating the surface layer with a beam of infrared radiation and measuring a probe response comprising at least one of a resonance frequency shift and a phase shift of a resonance of a probe in response to infrared radiation absorbed by the surface layer.
    Type: Grant
    Filed: July 9, 2018
    Date of Patent: January 18, 2022
    Assignee: Bruker Nano, Inc.
    Inventors: Kevin Kjoller, Craig Prater
  • Publication number: 20210165019
    Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
    Type: Application
    Filed: February 9, 2021
    Publication date: June 3, 2021
    Inventors: Craig Prater, Kevin Kjoller
  • Patent number: 11002665
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: May 11, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 10969405
    Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 ?m or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: April 6, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Roshan Shetty, Kevin Kjoller, Craig Prater
  • Patent number: 10942116
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: March 9, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 10914755
    Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: February 9, 2021
    Assignee: Bruker Nano, Inc.
    Inventors: Craig Prater, Kevin Kjoller
  • Publication number: 20200217874
    Abstract: System and Methods may be provided for performing chemical spectroscopy on samples from the scale of nanometers with surface sensitivity even on very thick sample. In the method, a signal indicative of infrared absorption of the surface layer is constructed by illuminating the surface layer with a beam of infrared radiation and measuring a probe response comprising at least one of a resonance frequency shift and a phase shift of a resonance of a probe in response to infrared radiation absorbed by the surface layer.
    Type: Application
    Filed: July 9, 2018
    Publication date: July 9, 2020
    Inventors: Kevin Kjoller, Craig Prater
  • Patent number: 10557789
    Abstract: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: February 11, 2020
    Assignee: Bruker Nano, Inc.
    Inventors: Craig Prater, Kevin Kjoller, Doug Gotthard, Qichi Hu
  • Publication number: 20200025677
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Application
    Filed: November 29, 2017
    Publication date: January 23, 2020
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Publication number: 20190391177
    Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
    Type: Application
    Filed: March 12, 2019
    Publication date: December 26, 2019
    Inventors: Craig Prater, Kevin Kjoller
  • Publication number: 20190120753
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Application
    Filed: October 9, 2018
    Publication date: April 25, 2019
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 10228388
    Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: March 12, 2019
    Assignee: Bruker Nano, Inc.
    Inventors: Craig Prater, Kevin Kjoller
  • Publication number: 20190011358
    Abstract: Systems and Methods may be provided for performing chemical spectroscopy on samples from the scale of nanometers with surface sensitivity even on very thick samples.
    Type: Application
    Filed: July 9, 2018
    Publication date: January 10, 2019
    Inventors: Kevin Kjoller, Craig Prater
  • Patent number: 10082523
    Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: September 25, 2018
    Assignee: Bruker Nano, Inc.
    Inventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
  • Publication number: 20180203039
    Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.
    Type: Application
    Filed: August 31, 2017
    Publication date: July 19, 2018
    Applicant: Anasys Instruments
    Inventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
  • Publication number: 20180180642
    Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 ?m or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip.
    Type: Application
    Filed: November 29, 2017
    Publication date: June 28, 2018
    Inventors: Roshan Shetty, Kevin Kjoller, Craig Prater