Abstract: A fault tolerant scannable glitch latch for use with scan chains that enable reset, debug and repairability of machines and parts is described. A scan shift enable signal controls a switch such that a stuck-at zero fault on a data input line is prevented from driving voltage to a state node or pulling the state node high during a scan chain operation. Propagation of the stuck-at zero fault is therefore eliminated. The scan shift enable signal also controls a switch that enables a parallel path to ground for the scan data and state node which would otherwise have been driven high due to the stuck-at zero fault.

Abstract: A method, implemented in a processor, of determining a likelihood of failure of a circuit to be made in accordance with a circuit design, and a computer-readable storage medium storing instructions to the processor for carrying out the method. A sensitivity of a figure of merit to each variable of a plurality of variables is determined by simulating operation of the circuit using the processor. Determining the sensitivity is based on a departure of each of the variables from a respective mean value, where the variables include at least one variable derived from measurements of a fabricated component or component combination to be included in the circuit. Results from the simulation are used to predict a failure probability of the circuit to be made in accordance with the circuit design.

Abstract: A fault tolerant scannable glitch latch for use with scan chains that enable reset, debug and repairability of machines and parts is described. A scan shift enable signal controls a switch such that a stuck-at zero fault on a data input line is prevented from driving voltage to a state node or pulling the state node high during a scan chain operation. Propagation of the stuck-at zero fault is therefore eliminated. The scan shift enable signal also controls a switch that enables a parallel path to ground for the scan data and state node which would otherwise have been driven high due to the stuck-at zero fault.

Abstract: A method is disclosed of determining a likelihood of failure of a circuit made in accordance with a circuit design based on at least one variable derived from measurements of a fabricated component or component combination included in the circuit design. Also disclosed is a processor configured to perform the method and a computer-readable medium storing method instructions.