Abstract: In one aspect, an integrated circuit (IC) includes a magnetic-field sensor. The magnetic-field sensor includes digital circuitry that includes a first and second analog-to-digital converter (ADC). The digital circuitry is configured to receive a first and second analog output signals and, using the first and second ADC, configured to convert the first and second analog output signals to a first and second digital signals. The magnetic-field sensor also includes diagnostic circuitry configured to receive, from the digital circuitry, an input signal related to the first and/or the second digital signals and configured to provide a test signal at a pin of the IC. In response to a range parameter, the diagnostic circuitry is further configured to provide the test signal comprising a range of codes from the first and/or the second ADC corresponding to the range parameter.

Abstract: In one aspect, an integrated circuit (IC) includes a magnetic-field sensor. The magnetic-field sensor includes digital circuitry that includes a first and second analog-to-digital converter (ADC). The digital circuitry is configured to receive a first and second analog output signals and, using the first and second ADC, configured to convert the first and second analog output signals to a first and second digital signals. The magnetic-field sensor also includes diagnostic circuitry configured to receive, from the digital circuitry, an input signal related to the first and/or the second digital signals and configured to provide a test signal at a pin of the IC. In response to a range parameter, the diagnostic circuitry is further configured to provide the test signal comprising a range of codes from the first and/or the second ADC corresponding to the range parameter.

Abstract: In one aspect, an integrated circuit (IC) includes a magnetic-field sensor. The magnetic field sensor includes a first and second magnetoresistance circuitries configured to receive a magnetic field signal from a target and convert the magnetic field signal received to a first signal and second signal; analog circuitry configured to receive the first and second signals; digital circuitry configured to receive a first and second analog output signals from analog circuitry and to convert the first and second analog output signals to a first and second digital signals representing a first and second channel output signals; and diagnostic circuitry configured to receive, from the digital circuitry, an input signal related to a separation of the first and second channel output signals, and configured to provide a test signal at a pin of the IC indicating whether a distance between the IC and the target complies with at least one rule.