Abstract: A method for redeeming multiple digital offers with a digital code is provided. The method includes retrieving one or more consumer identification values, forming an offer for the consumer, the offer including a digital incentive associated with a product or service of interest for the consumer, and creating, in a persistent record, an offer monitor to update the offer for the consumer and include the offer, the offers associated with multiple products and services of interest for the consumer. The persistent record includes multiple offers for the consumer and is stored at a network address associated with the consumer. The method also includes associating a digital code with the persistent record, and integrating the persistent record with a wallet application installed in the user device. A system and a non-transitory, computer-readable medium storing instructions to cause the system to perform the above method are also provided.

Abstract: Various test structures and methods for monitoring or controlling a semiconductor fabrication process are provided. One test structure formed on a wafer as a monitor for a lithography process includes a bright field target that includes first grating structures. The test structure also includes a dark field target that includes second grating structures. The first and second grating structures have one or more characteristics that are substantially the same as one or more characteristics of device structures formed on the wafer. In addition, the test structure includes a phase shift target having characteristics that are substantially the same as the characteristics of the bright field or dark field target except that grating structures of the phase shift target are shifted in optical phase from the first or second grating structures. One or more characteristics of the targets can be measured and used to determine parameter(s) of the lithography process.

Abstract: Disclosed are apparatus and methods for monitoring a characteristic associated with a product feature on a semiconductor product. A proxy target formed from at least one substructure that corresponds to a product feature is provided. The substructure is not individually resolvable by an optical tool. A characteristic of the proxy target is determined based on optically monitoring the proxy target using the optical tool. Based on the determined characteristic of the proxy target, it is then determined whether the corresponding product feature has a characteristic that is within a predetermined specification or whether a process parameter used to fabricate such product feature is within a predetermined specification. In a specific embodiment, the characteristic of the corresponding product feature includes a shape parameter and a position parameter.

Abstract: Various test structures and methods for monitoring or controlling a semiconductor fabrication process are provided. One test structure formed on a wafer as a monitor for a lithography process includes a bright field target that includes first grating structures. The test structure also includes a dark field target that includes second grating structures. The first and second grating structures have one or more characteristics that are substantially the same as one or more characteristics of device structures formed on the wafers. In addition, the test structure includes a phase shift target having characteristics that are substantially the same as the characteristics of the bright field or dark field target except that grating structures of the phase shift target are shifted in optical phase from the first or second grating structures. One or more characteristics of the targets can be measured and used to determine parameter(s) of the lithography process.

Abstract: A traveler comprises a track with two lateral side grooves and a top surface, and a car slideably held on the track. The car has first and second lateral side portions, with bearing means in each portion for engaging respective of the track side grooves. The car further has thrust bearings removably held in a race in a car center portion for engaging the track top surface when the car may be tilted towards one or the other lateral sides, as may occur when the car is under a load from that lateral side.

Abstract: A slider assembly useful as a working part on a sailing vessel includes a track and a slider mounted on the track. The slider includes a pair of U-shaped end pieces held in a spaced relationship by side pins and a central pin. Tubular bushings are mounted on the side pins and in sliding engagement with the grooves of the track.

Abstract: A low profile fairlead has a plurality of blocks support in a spaced relation along the arc of a circle to simulate a single bearing block of larger diameter.