Patents by Inventor Kevin P. Bailey

Kevin P. Bailey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10215714
    Abstract: Method and system for detecting defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect area of potential defect at location on surface of object based on predictable pattern consisting of bright and shadow regions. Kernels are defined corresponding to configurations of dark field illumination sources to enhance detecting potential defect. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypothesis of potential defect at location on surface of object. The hypothesis is classified with a classifier to determine whether the potential defect is true defect. The classifier is trained with training data having characteristics of true defect. The method provides efficient automated detection of micro defects on surface of object.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: February 26, 2019
    Assignee: SIEMENS ENERGY, INC.
    Inventors: Ziyan Wu, Rameswar Panda, Jan Ernst, Kevin P. Bailey
  • Publication number: 20190057498
    Abstract: Method and system for detecting line defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect areas of potential defects based on predictable pattern consisting of bright and shadow regions. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypotheses of potential defects at locations on surface of object. The hypotheses are classified to determine whether the potential defects are true defects at the locations. Line defect is detected by refining line segments detected on the processed image based on criteria. The criteria include distance from the true defects to the line segments and slops between the true defects and the line segments are less than threshold values.
    Type: Application
    Filed: August 16, 2017
    Publication date: February 21, 2019
    Inventors: Rameswar Panda, Ziyan Wu, Jan Ernst, Kevin P. Bailey
  • Publication number: 20190056333
    Abstract: Method and system for detecting defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect area of potential defect at location on surface of object based on predictable pattern consisting of bright and shadow regions. Kernels are defined corresponding to configurations of dark field illumination sources to enhance detecting potential defect. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypothesis of potential defect at location on surface of object. The hypothesis is classified with a classifier to determine whether the potential defect is true defect. The classifier is trained with training data having characteristics of true defect. The method provides efficient automated detection of micro defects on surface of object.
    Type: Application
    Filed: August 16, 2017
    Publication date: February 21, 2019
    Inventors: Ziyan Wu, Rameswar Panda, Jan Ernst, Kevin P. Bailey
  • Patent number: 10192301
    Abstract: Method and system for detecting line defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect areas of potential defects based on predictable pattern consisting of bright and shadow regions. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypotheses of potential defects at locations on surface of object. The hypotheses are classified to determine whether the potential defects are true defects at the locations. Line defect is detected by refining line segments detected on the processed image based on criteria. The criteria include distance from the true defects to the line segments and slops between the true defects and the line segments are less than threshold values.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: January 29, 2019
    Assignee: SIEMENS ENERGY, INC.
    Inventors: Rameswar Panda, Ziyan Wu, Jan Ernst, Kevin P. Bailey
  • Patent number: 10068326
    Abstract: A method for inspecting an object to assist in determining whether the object has a surface defect. The method includes moving the object in a first direction and illuminating the object under ambient lighting conditions. The method also includes capturing at least one image of the object under the ambient lighting conditions while the object moves in the first direction. In addition, the object is illuminated under object lighting conditions and at least one image of the object under the object lighting conditions is captured while the object moves in the first direction to provide at least one object image. Further, the method includes selecting at least one object image having at least one indication of a possible defect to provide images having defect candidates and comparing the defect candidates with previously defined characteristics associated with the defect to facilitate determination of whether a defect exists.
    Type: Grant
    Filed: March 18, 2016
    Date of Patent: September 4, 2018
    Assignee: SIEMENS ENERGY, INC.
    Inventors: Kevin P. Bailey, Ziyan Wu, Jan Ernst, Terrence Chen, Birgi Tamersoy
  • Patent number: 9838583
    Abstract: A method for verifying a lighting setup used for inspecting a micro defect. The method includes simulating a scene including a micro defect, light source and imaging device. A position of the light source and imaging device is then optimized to form an optimized simulated setup for viewing micro defect. A shadow calibration reference (SCR) having a simulated shadow field is then rendered in a location. Next, a physical imaging device and light source are positioned based on information from the optimized simulated setup to form an optimized physical setup. A physical SCR based on information from the SCR rendering is fabricated. Next, an image is captured of a physical SCR in a corresponding location associated with each SCR rendering. The optimized physical setup is verified if at least one shadow parameter from the SCR rendering is substantially similar to a corresponding shadow parameter in a corresponding image.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: December 5, 2017
    Assignee: SIEMENS ENERGY, INC.
    Inventors: Jan Ernst, Ziyan Wu, Kevin P. Bailey, Terrence Chen
  • Publication number: 20170270651
    Abstract: A method for inspecting an object to assist in determining whether the object has a surface defect. The method includes moving the object in a first direction and illuminating the object under ambient lighting conditions. The method also includes capturing at least one image of the object under the ambient lighting conditions while the object moves in the first direction. In addition, the object is illuminated under object lighting conditions and at least one image of the object under the object lighting conditions is captured while the object moves in the first direction to provide at least one object image. Further, the method includes selecting at least one object image having at least one indication of a possible defect to provide images having defect candidates and comparing the defect candidates with previously defined characteristics associated with the defect to facilitate determination of whether a defect exists.
    Type: Application
    Filed: March 18, 2016
    Publication date: September 21, 2017
    Inventors: Kevin P. Bailey, Ziyan Wu, Jan Ernst, Terrence Chen, Birgi Tamersoy
  • Publication number: 20170085760
    Abstract: A method for verifying a lighting setup used for inspecting a micro defect. The method includes simulating a scene including a micro defect, light source and imaging device. A position of the light source and imaging device is then optimized to form an optimized simulated setup for viewing micro defect. A shadow calibration reference (SCR) having a simulated shadow field is then rendered in a location. Next, a physical imaging device and light source are positioned based on information from the optimized simulated setup to form an optimized physical setup. A physical SCR based on information from the SCR rendering is fabricated. Next, an image is captured of a physical SCR in a corresponding location associated with each SCR rendering. The optimized physical setup is verified if at least one shadow parameter from the SCR rendering is substantially similar to a corresponding shadow parameter in a corresponding image.
    Type: Application
    Filed: September 21, 2015
    Publication date: March 23, 2017
    Inventors: Jan Ernst, Ziyan Wu, Kevin P. Bailey, Terrence Chen
  • Patent number: 9488618
    Abstract: Eddy current non-destructive examination and evaluation of physical properties of a component, such as a generator retaining ring, after experiencing potentially degrading thermal exposure during any stage of manufacture, assembly and service use, is performed to determine whether it is acceptable for service use, requires further modification (e.g., additional heat treatment processing) or whether is permanently unsuitable for service. Eddy current test measurements are correlated with component temperature exposure (e.g., absolute temperature and/or cumulative time-temperature heat absorption) and cumulative alteration of the component physical properties, such as, among others, material yield strength (YS), toughness, and tensile ductility. Using the eddy current test measurements and reference data correlating electrical conductivity with ring material thermal exposure, the component's physical properties are evaluated to determine its serviceability.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: November 8, 2016
    Assignee: Siemens Energy, Inc.
    Inventors: Kalyan Kannan, Kevin P. Bailey, Neil L. Kilpatrick
  • Publication number: 20150123512
    Abstract: Eddy current non-destructive examination and evaluation of physical properties of a component, such as a generator retaining ring, after experiencing potentially degrading thermal exposure during any stage of manufacture, assembly and service use, is performed to determine whether it is acceptable for service use, requires further modification (e.g., additional heat treatment processing) or whether is permanently unsuitable for service. Eddy current test measurements are correlated with component temperature exposure (e.g., absolute temperature and/or cumulative time-temperature heat absorption) and cumulative alteration of the component physical properties, such as, among others, material yield strength (YS), toughness, and tensile ductility. Using the eddy current test measurements and reference data correlating electrical conductivity with ring material thermal exposure, the component's physical properties are evaluated to determine its serviceability.
    Type: Application
    Filed: November 5, 2013
    Publication date: May 7, 2015
    Inventors: Kalyan Kannan, Kevin P. Bailey, Neil L. Kilpatrick
  • Publication number: 20140290368
    Abstract: A freestanding ultrasonic probe or transducer position relative to the inspected object is remotely tracked with a wireless transmitter/receiver or an optically based positioning system. Either type of positioning system generates a time stamped or commonly clocked positional data set that are sent to a post data processing module. The post data processing module creates a 3-D model of the inspected object, including location and size of indications in the inspected object, utilizing the positional data and inspection data generated by an ultrasonic testing instrument coupled to the freestanding probe/transducer.
    Type: Application
    Filed: March 12, 2014
    Publication date: October 2, 2014
    Applicant: Siemens Energy, Inc.
    Inventors: Yan Guo, Kevin P. Bailey, Joshua S. McConkey
  • Patent number: 7677217
    Abstract: A power assembly for an internal combustion engine includes a cylinder with a circular wall defining a first inside diameter. A piston is reciprocably housed within the cylinder. An integral, unitary piston deposit scraper is formed in a portion of the circular wall of the cylinder by upsetting a portion of the metallic wall so as to configure a piston scraper with a second inside diameter which is less than the first inside diameter. The inside diameter of the piston scraper closely matches that of the outside diameter of the top land of the piston. As a result, the piston scraper removes combustion deposits from the piston each time it moves into the top dead center position.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: March 16, 2010
    Assignee: General Electric Company
    Inventors: Yogesh Kumar, Richard J. McGowan, Bryan T. Jett, Neil X. Blythe, Kevin P. Bailey
  • Publication number: 20090095248
    Abstract: A power assembly for an internal combustion engine includes a cylinder with a circular wall defining a first inside diameter. A piston is reciprocably housed within the cylinder. An integral, unitary piston deposit scraper is formed in a portion of the circular wall of the cylinder by upsetting a portion of the metallic wall so as to configure a piston scraper with a second inside diameter which is less than the first inside diameter. The inside diameter of the piston scraper closely matches that of the outside diameter of the top land of the piston. As a result, the piston scraper removes combustion deposits from the piston each time it moves into the top dead center position.
    Type: Application
    Filed: October 10, 2007
    Publication date: April 16, 2009
    Inventors: Yogesh Kumar, Richard J. McGowan, Bryan T. Jett, Neil X. Blythe, Kevin P. Bailey