Patents by Inventor Kevin Paul HUMPHREY

Kevin Paul HUMPHREY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of porous film
    Patent number: 10161863
    Abstract: A method of calculating a first parameter of a first sample of a material is provided. The method includes determining a first and second wavelengths at which the material exhibits substantially no absorption; measuring a transmission of the first sample at the first wavelength; measuring a transmission of the first sample at the second wavelength; and calculating the first parameter of the first sample using a first multivariate regression model including first regression coefficients. The first parameter is a parameter which affects a total amount of radiation scattered by the first sample at the first and second wavelengths.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: December 25, 2018
    Assignee: NDC Technologies Limited
    Inventors: Kevin Paul Humphrey, Robert Peter Hammond
  • MEASUREMENT OF POROUS FILM
    Publication number: 20180024053
    Abstract: A method of calculating a first parameter of a first sample of a material is provided. The method includes determining a first and second wavelengths at which the material exhibits substantially no absorption; measuring a transmission of the first sample at the first wavelength; measuring a transmission of the first sample at the second wavelength; and calculating the first parameter of the first sample using a first multivariate regression model including first regression coefficients. The first parameter is a parameter which affects a total amount of radiation scattered by the first sample at the first and second wavelengths.
    Type: Application
    Filed: December 18, 2015
    Publication date: January 25, 2018
    Inventors: Kevin Paul HUMPHREY, Robert Peter HAMMOND