Abstract: A method digitally representing an integral non-linearity response for a device includes: (a) In no particular order: (1) Identifying locations of significant departures of the integral response, including: [a] Extracting first and second differential responses from the integral response in first and second device trim states. [b] Twice-filtering first and second differential responses to produce first and second filtered responses. [c] Determining difference between first and second filtered responses to produce a treated response. [d] Identifying a locus for each maximum of the treated response in a highest excursion range and in at least one lower excursion range. [e] Imposing zero amplitude on the treated response within a code range of each locus. Locations are centered within each code range. (2) Determining magnitude for each significant departure.

Abstract: A method for determining a minimization factor for improving linearity of an analog-to-digital converter including a plurality of components includes the steps of: (a) Evaluating integral non-linearity response of the apparatus to identify significant departures of the response greater than a predetermined amplitude and to relate each respective significant departure with a respective identified component. (b) Determining magnitude of each significant departure. (c) Identifying a trimming factor related with each component. (d) Determining a residual gap magnitude for each significant departure. The residual gap magnitude comprises the magnitude of the respective significant departure less the trimming factor related with the identified component. (e) Determining the minimization factor as a sum of the residual gap magnitudes for a selected plurality of the identified components.

Abstract: An electronic device evaluation system (100) includes a potential customer located at a site (102) that accesses a company site (106) via a computer network such as the internet (104). The company site (106) includes a computer such as a server (108) which is coupled to one or more evaluation boards (110, 112) and instrumentation (114). Using the system (100) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (106). Using system (100) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.

Abstract: An electronic device evaluation system (100) includes a potential customer located at a site (102) that accesses a company site (106) via a computer network such as the internet (104). The company site (106) includes a computer such as a server (108) which is coupled to one or more evaluation boards (110, 112) and instrumentation (114). Using the system (100) a potential customer or visitor can remotely evaluate an electronic device or system of interest using parameters he selects and the results are sent back after the evaluation is conducted at the company site (106). Using system (100) potential customers, site visitors, etc. can evaluate electronic devices/systems of interest in real-time without the need to purchase an evaluation board and spend the time and resources needed to conduct the tests.