Abstract: A burn-in system includes a testing stage configured to stress test one an integrated circuit and a power stage having a voltage control mode and a current control mode. The power stage is configured to supply power to the testing stage. One embodiment of the power stage includes a pulse width modulator, a current control circuit and a voltage control circuit. The pulse width modulator is configured to generate a modulated power output that is coupled to the testing stage. The current control circuit is configured to produce a current error output signal that is based on a difference between a measured load current, which is indicative of the current that is supplied to the testing stage by the modulated power output, and target load current.

Abstract: A burn-in system includes single and dual power modes, a testing stage, first and second power stages, a single mode power control circuit and a dual mode power control circuit. When the burn-in system is in the single power mode, the first power stage produces a first power output to the testing stage based on a single mode error signal generated by the single mode power control circuit. When the burn-in system is in the dual power mode the first power stage produces the first power output and the second power stage produces a second power output in response to a dual mode error signal produced by the dual mode power control circuit. The first and second power outputs are coupled together when the burn-in system is in the dual power mode.