Abstract: A VME Slave Tester includes board selector logic for indicating when an address being monitored is selected for a data transfer, and a data transfer circuit for generating signals necessary to complete data transfers, and for indicating an unsuccessful data transfer. In addition, the VME Slave Tester includes first in/first out (FIFO) logic for storing data that must be written to the board and for outputting data that must be read from the board, and front panel control logic for interfacing external switches to the VME Slave Tester digital circuitry. Finally, the VME Slave Tester includes display logic for indicating the number of items of data presently stored and for viewing the stored data and the present address and AM Code configurations of the VME Slave Tester.