Abstract: A system to carry out solvent targeted recovery and precipitation (STRAP) to recover individual polymers from multilayer plastic films or mixed plastic wastes, comprising a down-sizing device to shred the plastic wastes into particles with a size and aspect ratio to be flowable; a feeder that conveys the plastic particles in a constant flow without bridging; a dissolution vessel to selectively dissolve an individual polymer component in a solvent; a high temperature filter to separate the dissolved polymer component from the undissolved plastics; a precipitator to precipitate the dissolved polymer component; a low temperature filter to separate the precipitated polymer component from the solvent; and a distillation unit to purify the recycled solvent. The unique design of the feeder and the dissolution vessels allows the system to run in a semi-continuous mode.

Abstract: The present disclosure relates to a method and a device for reconstructing a useful signal from an acquired signal made up of a plurality of samples representing physical quantities measured. The acquired signal includes the useful signal made noisy by a noise. The method includes decomposing the acquired signal on a predetermined wavelet decomposition base according to a given number of decomposition levels, and obtaining corresponding wavelet coefficients representing the acquired signal. The method further estimates a value representing the standard deviation of the noise from at least one portion of the wavelet coefficients; and implements an iterative method for reconstructing parsimonious signals on the acquired signal with a dictionary built from the wavelet decomposition base. The iterative method has an associated stop criterion that is calculated as a function of the value representing the estimated noise.

Abstract: The invention relates to a method for analyzing an integrated circuit, including a step for applying laser radiation at a point on the surface of the circuit, a step for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal, a step for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation, and a step for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. The invention also relates to an associated observation method and installation.

Abstract: A method for analyzing an integrated circuit includes: a step (102) for applying laser radiation at a point on the surface of the circuit; a step (106) for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal; a step (106) for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation; a step (106) for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. An associated observation method and installation are also disclosed.

Abstract: A method and installation for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, the following steps: applying a laser radiation, in one point of the surface of the integrated circuit; exciting the circuit; collecting the response of the circuit to the excitation; calculating the propagation time intervening between the excitation time and the response-collecting time; and creating an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application.

Abstract: The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying (102) a laser radiation, in one point of the surface of the integrated circuit; exciting (106) the circuit; collecting (108) the response of the circuit to the excitation; calculating (114) the propagation time intervening between the excitation time and the response-collecting time; and creating (116) an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application. The invention also concerns an installation for analyzing an integrated circuit.