Abstract: Described are flameless tracer munitions that are expelled from land mines or in hand thrown devices, which are used to mark an enemy person, vehicle body, or tires on the vehicle, with materials that emit infrared (IR) light, or heat emitting materials, or with a visible ink or a dye. The subjects are then identified and pursued because of the ink or seen with infrared reading or heat seeking devices. The devices are both long duration (several hours) and also have high light intensity tracing and marking. These munitions are non-impact and non-lethal; are non-toxic, and biodegradable.

Abstract: Small, medium and large caliber ammunition housing multiple projectiles are traced by means of a tracing/marking system utilizing chemlucent chemicals. The tracing/marking system also provides target marking when using small, medium and large caliber ammunition. Multiple projectiles are coated in a chemlucent chemical (referenced as the coating) and placed in the ammunition. Additionally, a liquid chemlucent chemical in a separate container is placed in the ammunition. When launched or fired from a gun or munition, the separate container breaks and the coating and the chemlucent chemicals combine, emitting light. The present system applies to multiple projectiles that are either launched in a scatter pattern from a gun or dispersed in a scatter pattern after the housing of the ammunition opens up outside the gun after firing. For military ammunition, the tracing/marking system may use buckshot, steel balls, or tungsten balls.

Abstract: A system for minimizing thermal reactor temperature overshoot and stabilization during a boat push. In one embodiment, the setpoint temperatures are reduced to a minimum value. As the temperature in the thermal reactor begins to increase, the setpoint temperatures are ramped back to the original setpoint temperature.

Abstract: A temperature control system for a thermal reactor is disclosed that addresses many of the problems in the art. In accordance with one aspect of the disclosed control system, a plurality of temperature controllers are employed. Each temperature controller employs one or more dynamic models that are optimized for a given temperature range. The temperature range over which a particular controller is optimized is preferably generally exclusive of the temperature ranges over which other controllers of the plurality of temperature controllers are optimized. In accordance with another aspect of the control system, the control system employs enhanced ramp trajectory logic. In accordance with another aspect of the control system, the control system employs a virtual temperature sensor in the event of a hardware failure of the corresponding non-virtual temperature sensor.

Abstract: A temperature control system for a thermal reactor is disclosed that addresses many of the problems in the art. In accordance with one aspect of the disclosed control system, a plurality of temperature controllers are employed. Each temperature controller employs one or more dynamic models that are optimized for a given temperature range. The temperature range over which a particular controller is optimized is preferably generally exclusive of the temperature ranges over which other controllers of the plurality of temperature controllers are optimized. In accordance with another aspect of the control system the control system employs enhanced ramp trajectory logic. In accordance with another aspect of the control system, the control system employs a virtual temperature sensor in the event of a hardware failure of the corresponding non-virtual temperature sensor.

Abstract: A temperature control system for a thermal reactor is disclosed that addresses many of the problems in the art. In accordance with one aspect of the disclosed control system, a plurality of temperature controllers are employed. Each temperature controller employs one or more dynamic models that are optimized for a given temperature range. The temperature range over which a particular controller is optimized is preferably generally exclusive of the temperature ranges over which other controllers of the plurality of temperature controllers are optimized. In accordance with another aspect of the control system, the control system employs enhanced ramp trajectory logic. In accordance with another aspect of the control system, the control system employs a virtual temperature sensor in the event of a hardware failure of the corresponding non-virtual temperature sensor.

Abstract: A temperature control system for a thermal reactor is disclosed that addresses many of the problems in the art. In accordance with one aspect of the disclosed control system, a plurality of temperature controllers are employed. Each temperature controller employs one or more dynamic models that are optimized for a given temperature range. The temperature range over which a particular controller is optimized is preferably generally exclusive of the temperature ranges over which other controllers of the plurality of temperature controllers are optimized. In accordance with another aspect of the control system, the control system employs enhanced ramp trajectory logic. In accordance with another aspect of the control system, the control system employs a virtual temperature sensor in the event of a hardware failure of the corresponding non-virtual temperature sensor.

Abstract: Controllers and associated methods for controlling a thermal reactor or other thermal semiconductor processors which include a heating element powered by a power source, and having profile thermocouples and spike thermocouples. One preferred method comprises the following steps: modeling thermal dynamic characteristics of the thermal reactor, the modeling step including providing thermocouple instrumented wafers in the thermal reactor, perturbing the thermal reactor by controlling the heating element using a stimulation sequence, and developing models based on changes in temperature created by the perturbations. The models are developed off-line and can include one or more models, such as a model of power versus spike thermocouple readings, a model of spike thermocouple readings versus profile thermocouple readings, and a model of profile thermocouple readings versus thermocouple instrumented wafer readings.