Abstract: A method for determining a contact resistance may include performing voltage and current measurements associated with a pin of a device under test (DUT) using a parameter measurement circuit, obtaining at least three voltage-current measurement pairs. An emission coefficient may be determined from the voltage-current measurement pairs. A contact resistance may be calculated from the emission coefficient and the voltage-current measurement pairs and stored.

Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.

Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.