Abstract: Pattern recognition is used to proactively treat defects of repeating circuit topologies. A component of a computing environment is monitored for failures. The component includes one or more repeating circuit topologies. A determination is made as to whether a new failure within a repeating circuit topology of the one or more repeating circuit topologies has occurred within a predefined amount of time from a previous failure matching a selected pattern, in which the selected pattern indicates a non-contiguous growing defect. Based on determining the new failure has occurred within the predefined amount of time from the previous failure matching the selected pattern, corrective action for the component is proactively taken.

Abstract: Pattern recognition is used to proactively treat defects of repeating circuit topologies. A component of a computing environment is monitored for failures. The component includes one or more repeating circuit topologies. A determination is made as to whether a new failure within a repeating circuit topology of the one or more repeating circuit topologies has occurred within a predefined amount of time from a previous failure matching a selected pattern, in which the selected pattern indicates a non-contiguous growing defect. Based on determining the new failure has occurred within the predefined amount of time from the previous failure matching the selected pattern, corrective action for the component is proactively taken.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: A system for providing error detection or correction on a data bus includes one or more caches coupled to a central processing unit and to a hub by one or more buses. The system also includes a plurality of arrays, each array disposed on one of the buses. Each of the arrays includes a plurality of storage cells disposed in an insensitive direction and an error control mechanism configured to detect an error in the plurality of storage cells.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.

Abstract: A method for providing error detection and/or correction to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding a first error control mechanism to the array of storage cells in the insensitive direction. The method also includes adding a second error control mechanism to the array of storage cells in the sensitive direction. The second error control mechanism has a higher Hamming distance than the first error control mechanism.

Abstract: A method for configuring the placement of a plurality of storage cells on an integrated circuit includes grouping the plurality of storage cells into a plurality of words, where each of the plurality of words is protected by an error control mechanism. The method also includes placing each of the storage cells on the integrated circuit such that a distance between any two of the storage cells belonging to one of the plurality of words is greater than a minimum distance. The minimum distance is configured such that a probability of any of the plurality of words experiencing multiple radiation induced errors is below a threshold value.

Abstract: A method for adding error detection, or error detection combined with error correction, to a plurality of register banks includes grouping the plurality of register banks into an array. The method also includes adding a first error control mechanism to the array in a first direction and adding a second error control mechanism to the array in a second direction. The method further includes adding a product code to the array, the product code including applying the second error control mechanism to a plurality of bits of the first error control mechanism.

Abstract: A method for providing error detection and/or correction to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding a first error control mechanism to the array of storage cells in the insensitive direction. The method also includes adding a second error control mechanism to the array of storage cells in the sensitive direction. The second error control mechanism has a higher Hamming distance than the first error control mechanism.

Abstract: A system for providing error detection or correction on a data bus includes one or more caches coupled to a central processing unit and to a hub by one or more buses. The system also includes a plurality of arrays, each array disposed on one of the buses. Each of the arrays includes a plurality of storage cells disposed in an insensitive direction and an error control mechanism configured to detect an error in the plurality of storage cells.

Abstract: A method for configuring the placement of a plurality of storage cells on an integrated circuit includes grouping the plurality of storage cells into a plurality of words, where each of the plurality of words is protected by an error control mechanism. The method also includes placing each of the storage cells on the integrated circuit such that a distance between any two of the storage cells belonging to one of the plurality of words is greater than a minimum distance. The minimum distance is configured such that a probability of any of the plurality of words experiencing multiple radiation induced errors is below a threshold value.

Abstract: A method for providing error detection, or error detection combined with error correction, to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding an error control mechanism to the array of storage cells in the insensitive direction. The insensitive direction is a direction perpendicular to a width of a gate conductor of the storage cells.

Abstract: A method for adding error detection, or error detection combined with error correction, to a plurality of register banks includes grouping the plurality of register banks into an array. The method also includes adding a first error control mechanism to the array in a first direction and adding a second error control mechanism to the array in a second direction. The method further includes adding a product code to the array, the product code including applying the second error control mechanism to a plurality of bits of the first error control mechanism.

Abstract: A memory subsystem with positional read data latency that includes one or more memory modules, a memory controller and one or more memory busses is provided. The memory controller includes instructions for providing positional read data latency. The memory modules and the memory controller are interconnected via the memory busses.

Abstract: A method of regulating power for multi-node computer system components has a closed-ring path that links all the power governors and circulating in the ring is a system power number that represents the power consumption of the entire system. Meanwhile, all the governors keep counting its local power consumption. Each time the number passes a governor, the governor will add its local count onto this number, store this number for future usage, and reset its local count. When the new number returns back to the same power governor, the governor will subtract the new number with its stored number to calculate the overall system power usage within a number circulation period. The system power number overflow problem is also detected with a counter if the incoming number is smaller then the number previously stored. The counter whose counting capacity is greater than the maximum system power usage on all the nodes within a number circulation period.

Abstract: A self test function in the Memory Controller is utilized to generate unique and continuous data patterns for each of the words which are stored into two consecutive DRAM addresses in two spaced store operations. The self test function then generates fetch commands to read back the unique data patterns from the two DRAM addresses. In the fetch operations, the data transmission for each operation and between both operations is contiguous (no gaps). A self test data comparison function is then used to compare these fetched data words to data patterns which are generated from the self test data generator. Bit error counters from the memory controller keeps track of any miscompares. By reading out a unique signature from these bit counters, it can be determined whether the store path data are misaligned early or late or correct and/or the fetch path data are misaligned early or late or correct. In addition, the exact number of cycles the data are early or late is known.

Abstract: A packetized cascade memory system including a plurality of memory assemblies, a memory bus including multiple segments, a bus repeater module and a segment level sparing module. The bus repeater module is in communication with two or more of the memory assemblies via the memory bus. The segment level sparing module provides segment level sparing for the communication bus upon segment failure.

Abstract: A method for regulating system power using a power governor for DRAM in a multi-node computer system regulating memory power consumption of an entire computer system employs a closed ring that connects all the power governors within the system to enable them to work in concert so that each of the power governors has the knowledge of memory activities within the entire system. They then control and limit the memory usage based on a true overall measurement instead of just local measurement. Each nodal power governor has memory command counter, ring number receiver, ring number transmitter, governor activation controller, and memory traffic controller. Each nodal power governor counts the weight of memory command. The degree of limiting actual memory activities can be programmed when the governor is active. Besides, the command priorities can be adjusted in activation too. A hybrid ring structure can be employed with a nodal power structure to achieve the fastest number circulation speed economically.