Abstract: A method for forming an isolation wall in a silicon semiconductor substrate wherein a trench is etched into the silicon using a hard mask, a layer of silicon dioxide is formed on the side walls of the trench, a filling of polysilicon is placed in the region between the side wall layers, the polysilicon is planarized by etching while the hard mask remains in place, and the hard mask then is stripped from the silicon, permitting field oxide to be grown over the trench region.

Abstract: An SOI/DI IC chip including a handle wafer in the form of a section of silicon substrate contiguous with the layer of insulation beneath the silicon slice containing the device regions separated by trenches filled with low-conductivity polysilicon dielectric. One of the trenches is etched through the layer of insulation, and the polysilicon in that trench is doped to provide desired electrical conductivity to establish electrical contact with the handle wafer. Metallization is applied over the top of this one trench to make possible electrical connection to the handle wafer from above the chip by use of conventional wiring techniques.

Abstract: An SOI/DI IC chip including a handle wafer in the form of a section of silicon substrate contiguous with the layer of insulation beneath the silicon slice containing the device regions separated by trenches filled with low-conductivity polysilicon dielectric. One of the trenches is etched through the layer of insulation, and the polysilicon in that trench is doped to provide desired electrical conductivity to establish electrical contact with the handle wafer. Metallization is applied over the top of this one trench to make possible electrical connection to the handle wafer from above the chip by use of conventional wiring techniques.